Correlative Approach for Atom Probe Sample Preparation of Interfaces Using Plasma Focused Ion Beam Without Lift-Out.

Plasma focused ion beam microscopy (PFIB) is a recent nanofabrication technique that is suitable for site-specific atom probe sample preparation. Higher milling rates and fewer artifacts make it superior to Ga+ FIBs for the preparation of samples where large volumes of material must be removed, for example, when trying to avoid lift-out techniques. Transmission Kikuchi diffraction (TKD) is a method that has facilitated phase identification and crystallographic measurements in such electron transparent samples. We propose a procedure for preparing atom probe tomography (APT) tips from mechanically prepared ribbons by using PFIB. This is highly suitable for the preparation of atom probe tips of interfaces such as interphase boundaries from challenging materials where lift-out tips easily fracture. Our method, in combination with TKD, allows the positioning of regions of interest such as interfaces close to the apex of the tip. We showcase the efficacy of the proposed method in a case study on Alloy 718, where the interface between γ-matrix and δ-phase has not been yet extensively explored through APT due to preparation challenges. Results show depletion of γ″-precipitates near the γ/δ interface. A quantitative evaluation of the composition of phases in the bulk versus near the interface is achieved.

Atom Probe Microscopy of Strengthening Effects in Alloy 718.

Polycrystalline Ni-based superalloys for aerospace and power generation applications are often precipitation hardened to achieve strengthening at elevated temperatures. Here, atom probe microscopy has become an essential tool to study the complex morphology of nanoscale precipitates. This study focuses on Alloy 718, which is hardened by semi-coherent, ordered γ' (Ni3(Al, Ti)) and γ″ (Ni3(Nb)) particles. According to previous research, these particles often occur as duplets or triplets with a stacking sequence dependent on prior processing. This creates various interfaces with a strong impact on the mechanical properties, highlighting the importance of quantitative studies which are challenging with electron microscopy. We present atom probe data reconstruction and analysis approaches particularly suited for precipitation hardened superalloys. While voltage atom probe allows for an accurate reconstruction, the acquired data volume is often limited. Laser-assisted atom probe provides statistically significant data, but the loss of crystallographic information requires correlation with voltage-mode datasets. We further describe an advanced iso-surface method where initially arbitrarily chosen concentration thresholds of Al + Ti for γ' and Nb for γ″ particles are optimized. Recognizing the importance of the precipitate stacking order, the different types of precipitate interfaces are quantified, and these methods may be applicable to other engineering alloys.

Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data.

Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater detail. For the first time, the accuracy of crystallographic measurements made using APT will be independently verified using TKD. Experimental data from two atom probe tips, one a nanocrystalline Al-0.5Ag alloy specimen collected on a straight flight-path atom probe and the other a high purity Mo specimen collected on a reflectron-fitted instrument, will be compared. We find that the average minimum misorientation angle, calculated from calibrated atom probe reconstructions with two different pole combinations, deviate 0.7° and 1.4°, respectively, from the TKD results. The type of atom probe and experimental conditions appear to have some impact on this accuracy and the reconstruction and measurement procedures are likely to contribute further to degradation in angular resolution. The challenges and implications of this correlative approach will also be discussed.

3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods.

3D electron backscatter diffraction (3D-EBSD) is a method of obtaining 3-dimensional crystallographic data through serial sectioning. The recent advancement of using a Xe+ plasma focused ion beam for sectioning along with a complementary metal-oxide semiconductor based EBSD detector allows for an improvement in the trade-off between volume analyzed and spatial resolution over most other 3D characterization techniques. Recent publications from our team have focused on applying 3D-EBSD to understand microstructural phenomena in Ti-6Al-4V microstructures as a function of electron beam scanning strategies in electron beam powder bed fusion additive manufacturing. The microstructures resulting from this process have fine features, with α laths as small as 1 µm interwoven in a highly complex fashion, presenting a significant challenge to characterize. Over the course of these fundamental works, we have developed best-practice 3D-EBSD collection protocols and advanced methods for 3D data reconstruction and analysis of such microstructures which remain unpublished. These methods may be of interest to the 3D materials characterization community, especially considering the lack of standard commercial software tools. Thus, the current paper elaborates on the methods and analysis used to characterize fine titanium microstructures using 3D-EBSD and presents a detailed description of the new algorithms developed for probing the unique features therein. The new analyses include algorithms for identifying intervariant boundary types, classifying three-variant clusters, assigning grains to variants, and quantifying interconnectivity of branched α platelets.

3D electron backscatter diffraction study of α lath morphology in additively manufactured Ti-6Al-4V.

Titanium alloys exhibit complex, multi-phase microstructures which form during liquid-solid and solid-solid phase transformations. These phase transformations govern the microstructural evolution and are potentially more complex during additive manufacturing due to large thermal gradients and inhomogeneities. The prototypical fundamental unit of titanium microstructures are the α laths, and investigations into their three-dimensional morphology may provide new insights. A prior ß-grain boundary, 3-variant clusters and interconnected laths were studied in 3D in electron-beam printed Ti-6Al-4V using a plasma FIB. These key features are of interest for studying variant selection in additive manufacturing.

Correlative microscopy of a carbide-free bainitic steel.

In this work a carbide-free bainitic steel was examined by a novel correlative microscopy approach using transmission Kikuchi diffraction (TKD) and transmission electron microscopy (TEM). The individual microstructural constituents could be identified by TKD based on their different crystal structure for bainitic ferrite and retained austenite and by image quality for the martensite-austenite (M-A) constituent. Subsequently, the same area was investigated in the TEM and a good match of these two techniques regarding the identification of the area position and crystal orientation could be proven. Additionally, the M-A constituent was examined in the TEM for the first time after preceded unambiguous identification using a correlative microscopy approach. The selected area diffraction pattern showed satellites around the main reflexes which might indicate a structural modulation.