Resolving Atomic Connectivity in Graphene Nanostructure Junctions.

Dienel, Thomas; Kawai, Shigeki; Söde, Hajo; Feng, Xinliang; Müllen, Klaus; Ruffieux, Pascal; Fasel, Roman; Gröning, Oliver

Dienel, Thomas; Kawai, Shigeki; Söde, Hajo; Feng, Xinliang; Müllen, Klaus; Ruffieux, Pascal; Fasel, Roman; Gröning, Oliver.

Afiliação

Dienel T; nanotech@surfaces Laboratory, Empa - Swiss Federal Laboratories for Materials Science and Technology, Ueberlandstrasse 129, 8600 Duebendorf, Switzerland.
Kawai S; Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
Söde H; §PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Japan.
Feng X; nanotech@surfaces Laboratory, Empa - Swiss Federal Laboratories for Materials Science and Technology, Ueberlandstrasse 129, 8600 Duebendorf, Switzerland.
Müllen K; â¥Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany.
Ruffieux P; â¥Department of Chemistry and Food Chemistry, Technische Universität Dresden, 01062 Dresden, Germany.
Fasel R; â¥Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany.
Gröning O; nanotech@surfaces Laboratory, Empa - Swiss Federal Laboratories for Materials Science and Technology, Ueberlandstrasse 129, 8600 Duebendorf, Switzerland.

Nano Lett ; 15(8): 5185-90, 2015 Aug 12.

Article em En | MEDLINE | ID: mdl-26177075

Palavras-chave

Two-dimensional material; graphene nanoribbon; nc-AFM; noncontact atomic force microscopy; scanning tunneling microscopy; tight binding

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Suíça

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