Vectorial scanning force microscopy using a nanowire sensor.

Rossi, Nicola; Braakman, Floris R; Cadeddu, Davide; Vasyukov, Denis; Tütüncüoglu, Gözde; Fontcuberta I Morral, Anna; Poggio, Martino

Rossi, Nicola; Braakman, Floris R; Cadeddu, Davide; Vasyukov, Denis; Tütüncüoglu, Gözde; Fontcuberta I Morral, Anna; Poggio, Martino.

Afiliação

Rossi N; Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
Braakman FR; Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
Cadeddu D; Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
Vasyukov D; Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
Tütüncüoglu G; Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland.
Fontcuberta I Morral A; Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland.
Poggio M; Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.

Nat Nanotechnol ; 12(2): 150-155, 2017 02.

Article em En | MEDLINE | ID: mdl-27749834

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nat Nanotechnol Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Suíça

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