Operando Analysis of Electron Devices Using Nanodiamond Thin Films Containing Nitrogen-Vacancy Centers.

Uchiyama, Haruki; Saijo, Soya; Kishimoto, Shigeru; Ishi-Hayase, Junko; Ohno, Yutaka

Uchiyama, Haruki; Saijo, Soya; Kishimoto, Shigeru; Ishi-Hayase, Junko; Ohno, Yutaka.

Afiliação

Uchiyama H; Department of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.
Saijo S; School of Fundamental Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan.
Kishimoto S; Department of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.
Ishi-Hayase J; School of Fundamental Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan.
Ohno Y; Department of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.

ACS Omega ; 4(4): 7459-7466, 2019 Apr 30.

Article em En | MEDLINE | ID: mdl-31459842

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Omega Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Japão

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