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High-precision atomic-scale strain mapping of nanoparticles from STEM images.
Luo, Xiaonan; Varambhia, Aakash; Song, Weixin; Ozkaya, Dogan; Lozano-Perez, Sergio; Nellist, Peter D.
Afiliação
  • Luo X; Department of Materials, University of Oxford, Parks Road, OX1 3PH, Oxford, United Kingdom.
  • Varambhia A; Johnson Matthey Technology Centre, Sonning Common, RG4 9NH, Reading, United Kingdom.
  • Song W; Department of Materials, University of Oxford, Parks Road, OX1 3PH, Oxford, United Kingdom.
  • Ozkaya D; Johnson Matthey Technology Centre, Sonning Common, RG4 9NH, Reading, United Kingdom.
  • Lozano-Perez S; Department of Materials, University of Oxford, Parks Road, OX1 3PH, Oxford, United Kingdom.
  • Nellist PD; Department of Materials, University of Oxford, Parks Road, OX1 3PH, Oxford, United Kingdom. Electronic address: peter.nellist@materials.ox.ac.uk.
Ultramicroscopy ; 239: 113561, 2022 Sep.
Article em En | MEDLINE | ID: mdl-35640478

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Reino Unido

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Reino Unido