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Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy.
Ribet, Stephanie M; Zeltmann, Steven E; Bustillo, Karen C; Dhall, Rohan; Denes, Peter; Minor, Andrew M; Dos Reis, Roberto; Dravid, Vinayak P; Ophus, Colin.
Afiliação
  • Ribet SM; Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA.
  • Zeltmann SE; International Institute of Nanotechnology, Northwestern University, Evanston, IL 60208, USA.
  • Bustillo KC; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
  • Dhall R; Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University, Ithaca, NY 14853, USA.
  • Denes P; Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA 94720, USA.
  • Minor AM; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
  • Dos Reis R; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
  • Dravid VP; Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
  • Ophus C; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Microsc Microanal ; 29(6): 1950-1960, 2023 Dec 21.
Article em En | MEDLINE | ID: mdl-37851063
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos