Enhancing GaN/AlxGa1-xN-Based Heterojunction Phototransistors: The Role of Graded Base Structures in Performance Improvement.

This research explores the architecture and efficacy of GaN/AlxGa1-xN-based heterojunction phototransistors (HPTs) engineered with both a compositionally graded and a doping-graded base. Employing theoretical analysis along with empirical fabrication techniques, HPTs configured with an aluminum compositionally graded base were observed to exhibit a substantial enhancement in current gain. Specifically, theoretical models predicted a 12-fold increase, while experimental evaluations revealed an even more pronounced improvement of approximately 27.9 times compared to conventional GaN base structures. Similarly, HPTs incorporating a doping-graded base demonstrated significant gains, with theoretical predictions indicating a doubling of current gain and experimental assessments showing a 6.1-fold increase. The doping-graded base implements a strategic modulation of hole concentration, ranging from 3.8 × 1016 cm-3 at the base-emitter interface to 3.8 × 1017 cm-3 at the base-collector junction. This controlled gradation markedly contributes to the observed enhancements in current gain. The principal mechanism driving these improvements is identified as the increased electron drift within the base, propelled by the intrinsic electric field inherent to both the compositionally and doping-graded structures. These results highlight the potential of such graded base designs in enhancing the performance of GaN/AlxGa1-xN HPTs and provide crucial insights for the advancement of future phototransistor technologies.

High Performance Acoustic Wave Nitrogen Dioxide Sensor with Ultraviolet Activated 3D Porous Architecture of Ag-Decorated Reduced Graphene Oxide and Polypyrrole Aerogel.

Surface acoustic wave (SAW) devices have been widely explored for real-time monitoring of toxic and irritant chemical gases such as nitrogen oxide (NO2), but they often have issues such as a complicated process of the sensing layer, low sensitivity, long response time, irreversibility, and/or requirement of high temperatures to enhance sensitivity. Herein, we report a sensing material design for room-temperature NO2 detection based on a 3D porous architecture of Ag-decorated reduced graphene oxide-polypyrrole hybrid aerogels (rGO-PPy/Ag) and apply UV activation as an effective strategy to further enhance the NO2 sensing performance. The rGO-PPy/Ag-based SAW sensor with the UV activation exhibits high sensitivity (127.68 Hz/ppm), fast response/recovery time (36.7 s/58.5 s), excellent reproducibility and selectivity, and fast recoverability. Its enhancement mechanisms for highly sensitive and selective detection of NO2 are based on a 3D porous architecture, Ag-decorated rGO-PPy, p-p heterojunction in rGO-PPy/Ag, and UV photogenerated carriers generated in the sensing layer. The scientific findings of this work will provide the guidance for future exploration of next-generation acoustic-wave-based gas sensors.

Epitaxial Lift-Off of Flexible GaN-Based HEMT Arrays with Performances Optimization by the Piezotronic Effect.

High-electron-mobility transistors (HEMTs) are a promising device in the field of radio frequency and wireless communication. However, to unlock the full potential of HEMTs, the fabrication of large-size flexible HEMTs is required. Herein, a large-sized (> 2 cm2) of AlGaN/AlN/GaN heterostructure-based HEMTs were successfully stripped from sapphire substrate to a flexible polyethylene terephthalate substrate by an electrochemical lift-off technique. The piezotronic effect was then induced to optimize the electron transport performance by modulating/tuning the physical properties of two-dimensional electron gas (2DEG) and phonons. The saturation current of the flexible HEMT is enhanced by 3.15% under the 0.547% tensile condition, and the thermal degradation of the HEMT was also obviously suppressed under compressive straining. The corresponding electrical performance changes and energy diagrams systematically illustrate the intrinsic mechanism. This work not only provides in-depth understanding of the piezotronic effect in tuning 2DEG and phonon properties in GaN HEMTs, but also demonstrates a low-cost method to optimize its electronic and thermal properties.

High quality N-polar GaN films grown with varied V/III ratios by metal-organic vapor phase epitaxy.

We studied the growths and characterizations of N-polar GaN films grown with constant and varied V/III ratios in high-temperature (HT) GaN growth on offcut c-plane sapphire substrates by metal-organic vapor phase epitaxy. It is found that growth with a constantly low V/III ratio resulted in a high crystallinity but a rough surface and a high oxygen concentration, whereas growth with a high V/III ratio led to a smooth surface but a high carbon concentration and a degraded crystallinity. The overall quality of the N-polar GaN epilayer cannot be effectively improved simply by tuning the V/III ratio. The growth with varied V/III ratios was conducted by lowering the V/III ratio in the initial HT-GaN growth and keeping the V/III ratio constantly high in the subsequent growth. Such a change of V/III ratio resulted in a 3D-to-2D like growth mode transition during the early stage of HT-GaN growth which helped reduce threading dislocations and suppress impurity incorporation. By optimizing the nucleation temperature and the thickness of the initial low-V/III-ratio layer, the minimum full-widths at half-maximum of (002̄)/(102̄) rocking curves obtained were 288/350 arcsec and the oxygen concentration was reduced significantly from 1.6 × 1018 cm-3 to 3.7 × 1017 cm-3 while keeping a hillock-free smooth surface morphology. The overall quality of the N-polar GaN films was considerably improved. We believe that this simple, yet effective growth technique has great application prospects for high-performance N-polar GaN-based electron devices.

Performance enhancement of AlGaN-based 365 nm ultraviolet light-emitting diodes with a band-engineering last quantum barrier.

In this Letter, the characteristics of the AlGaN-based near-ultraviolet light-emitting diodes with a band-engineering last quantum barrier (LQB) were analyzed experimentally and numerically. The experimental results show that the peak wavelengths of UV-LEDs are around 368 nm with a full width at half-maximum of 12-14 nm, and the optical and electrical properties are improved by using an AlxGa1-xN LQB with a gradually decreasing Al content. The designed LQB can reduce the forward voltage from 4.35 to 4.29 V and markedly enhance LOP by 47.4% at an injection current of 200 mA, compared with the original structure. These improvements are mainly attributed to less electron leakage and higher hole injection efficiency, resulting from the weakened polarization field in the electron-blocking layer (EBL) and LQB, as well as the alleviation of the band bending at the EBL/LQB interface.

High-Quality GaN Epilayers Achieved by Facet-Controlled Epitaxial Lateral Overgrowth on Sputtered AlN/PSS Templates.

It is widely believed that the lack of high-quality GaN wafers severely hinders the progress in GaN-based devices, especially for defect-sensitive devices. Here, low-cost AlN buffer layers were sputtered on cone-shaped patterned sapphire substrates (PSSs) to obtain high-quality GaN epilayers. Without any mask or regrowth, facet-controlled epitaxial lateral overgrowth was realized by metal-organic chemical vapor deposition. The uniform coating of the sputtered AlN buffer layer and the optimized multiple modulation guaranteed high growth selectivity and uniformity of the GaN epilayer. As a result, an extremely smooth surface was achieved with an average roughness of 0.17 nm over 3 × 3 µm2. It was found that the sputtered AlN buffer layer could significantly suppress dislocations on the cones. Moreover, the optimized three-dimensional growth process could effectively promote dislocation bending. Therefore, the threading dislocation density (TDD) of the GaN epilayer was reduced to 4.6 × 107 cm-2, which is about an order of magnitude lower than the case of two-step GaN on the PSS. In addition, contamination and crack in the light-emitting diode fabricated on the obtained GaN were also effectively suppressed by using the sputtered AlN buffer layer. All of these advantages led to a high output power of 116 mW at 500 mA with an emission wavelength of 375 nm. This simple, yet effective growth technique is believed to have great application prospects in high-performance TDD-sensitive optoelectronic and electronic devices.

High quality AlN epilayers grown on nitrided sapphire by metal organic chemical vapor deposition.

Influence of sapphire pretreatment conditions on crystalline quality of AlN epilayers has been investigated by metal organic chemical vapor deposition (MOCVD). Compared to alumination treatment, it is found that appropriate sapphire nitridation significantly straightens the surface atomic terraces and decreases the X-ray diffraction (0002) full width at half maximum (FWHM) to a minimum of 55 arcsec, indicating a great improvement of the tilting feature of the grain structures in the AlN epilayer. More importantly, there is no inversion domains (IDs) found in the AlN epilayers, which clarifies that optimal sapphire nitridation is promising in the growth of high quality AlN. It is deduced that the different interfacial atomic structures caused by various pretreatment conditions influence the orientation of the AlN nucleation layer grains, which eventually determines the tilting features of the AlN epilayers.

An Assisted Diagnosis System for Detection of Early Pulmonary Nodule in Computed Tomography Images.

Lung cancer is still the most concerned disease around the world. Lung nodule generates in the pulmonary parenchyma which indicates the latent risk of lung cancer. Computer-aided pulmonary nodules detection system is necessary, which can reduce diagnosis time and decrease mortality of patients. In this study, we have proposed a new computer aided diagnosis (CAD) system for detection of early pulmonary nodule, which can help radiologists quickly locate suspected nodules and make judgments. This system consists of four main sections: pulmonary parenchyma segmentation, nodule candidate detection, features extraction (total 22 features) and nodule classification. The publicly available data set created by the Lung Image Database Consortium (LIDC) is used for training and testing. This study selects 6400 slices from 80 CT scans containing totally 978 nodules, which is labeled by four radiologists. Through a fast segmentation method proposed in this paper, pulmonary nodules including 888 true nodules and 11,379 false positive nodules are segmented. By means of an ensemble classifier, Random Forest (RF), this study acquires 93.2, 92.4, 94.8, 97.6% of accuracy, sensitivity, specificity, area under the curve (AUC), respectively. Compared with support vector machine (SVM) classifier, RF can reduce more false positive nodules and acquire larger AUC. With the help of this CAD system, radiologist can be provided with a great reference for pulmonary nodule diagnosis timely.

Edge Dislocations Triggered Surface Instability in Tensile Epitaxial Hexagonal Nitride Semiconductor.

Understanding the semiconductor surface and its properties including surface stability, atomic morphologies, and even electronic states is of great importance not only for understanding surface growth kinetics but also for evaluating the degree to which they affect the devices' performance. Here, we report studies on the nanoscale fissures related surface instability in AlGaN/GaN heterostructures. Experimental results reveal that edge dislocations are actually the root cause of the surface instability. The nanoscale fissures are initially triggered by the edge dislocations, and the subsequent evolution is associated with tensile lattice-mismatch stress and hydrogen etching. Our findings resolve a long-standing problem on the surface instability in AlGaN/GaN heterostructures and will also lead to new understandings of surface growth kinetics in other hexagonal semiconductor systems.

High-quality AlN epitaxy on nano-patterned sapphire substrates prepared by nano-imprint lithography.

We report epitaxial growth of AlN films with atomically flat surface on nano-patterned sapphire substrates (NPSS) prepared by nano-imprint lithography. The crystalline quality can be greatly improved by using the optimized 1-µm-period NPSS. The X-ray diffraction ω-scan full width at half maximum values for (0002) and (102) reflections are 171 and 205 arcsec, respectively. The optimized NPSS contribute to eliminating almost entirely the threading dislocations (TDs) originating from the AlN/sapphire interface via bending the dislocations by image force from the void sidewalls before coalescence. In addition, reducing the misorientations of the adjacent regions during coalescence adopting the low lateral growth rate is also essential for decreasing TDs in the upper AlN epilayer.

Enhancement of optical polarization degree of AlGaN quantum wells by using staggered structure.

Staggered AlGaN quantum wells (QWs) are designed to enhance the transverse-electric (TE) polarized optical emission in deep ultraviolet (DUV) light- emitting diodes (LED). The optical polarization properties of the conventional and staggered AlGaN QWs are investigated by a theoretical model based on the k·p method as well as polarized photoluminescence (PL) measurements. Based on an analysis of the valence subbands and momentum matrix elements, it is found that AlGaN QWs with step-function-like Al content in QWs offers much stronger TE polarized emission in comparison to that from conventional AlGaN QWs. Experimental results show that the degree of the PL polarization at room temperature can be enhanced from 20.8% of conventional AlGaN QWs to 40.2% of staggered AlGaN QWs grown by MOCVD, which is in good agreement with the theoretical simulation. It suggests that polarization band engineering via staggered AlGaN QWs can be well applied in high efficiency AlGaN-based DUV LEDs.

High-Output-Power Ultraviolet Light Source from Quasi-2D GaN Quantum Structure.

Quasi-2D GaN layers inserted in an AlGaN matrix are proposed as a novel active region to develop a high-output-power UV light source. Such a structure is successfully achieved by precise control in molecular beam epitaxy and shows an amazing output power of ≈160 mW at 285 nm with a pulsed electron-beam excitation. This device is promising and competitive in non-line-of-sight communications or the sterilization field.

Mechanism of stress-driven composition evolution during hetero-epitaxy in a ternary AlGaN system.

Two AlGaN samples with different strain were designed to investigate mechanism of stress-driven composition evolution. It is discovered that AlGaN grown on AlN or (AlN/GaN superlattices (SLs))/GaN both consist of two distinct regions with different compositions: transition region and uniform region, which is attributed to the compositional pulling effect. The formation of the transition region is due to the partial stress release caused by the generation of misfit dislocations near the hetero-interface. And the Al composition in the uniform region depends on the magnitude of residual strain. The difference in relaxation degree is 80.5% for the AlGaN epilayers grown on different underlayers, leading to a large Al composition difference of 22%. The evolutionary process of Al composition along [0001] direction was investigated in detail.

Growth of high quality and uniformity AlGaN/GaN heterostructures on Si substrates using a single AlGaN layer with low Al composition.

By employing a single AlGaN layer with low Al composition, high quality and uniformity AlGaN/GaN heterostructures have been successfully grown on Si substrates by metal-organic chemical vapor deposition (MOCVD). The heterostructures exhibit a high electron mobility of 2150 cm(2)/Vs with an electron density of 9.3 × 10(12) cm(-2). The sheet resistance is 313 ± 4 Ω/◻ with ±1.3% variation. The high uniformity is attributed to the reduced wafer bow resulting from the balance of the compressive stress induced and consumed during the growth, and the thermal tensile stress induced during the cooling down process. By a combination of theoretical calculations and in situ wafer curvature measurements, we find that the compressive stress consumed by the dislocation relaxation (~1.2 GPa) is comparable to the value of the thermal tensile stress (~1.4 GPa) and we should pay more attention to it during growth of GaN on Si substrates. Our results demonstrate a promising approach to simplifying the growth processes of GaN-on-Si to reduce the wafer bow and lower the cost while maintaining high material quality.

Free and bound excitonic effects in Al0.5Ga0.5N/Al0.35Ga0.65N MQWs with different Si-doping levels in the well layers.

Free exciton (FX) and bound exciton (BX) in Al0.5Ga0.5N/Al0.35Ga0.65N multiple quantum wells (MQWs) with different Si-doping levels in the well layers are investigated by photoluminescence (PL) spectra. Low temperature (10 K) PL spectra identify a large binding energy of 87.4 meV for the BX in undoped sample, and 63.6 meV for the BX in Si-doped (2 × 10(18 ) cm(-3)) sample. They are attributed to O-bound and Si-bound excitons, respectively. The large binding energies of BX are assumed to originate from the strong quantum confinement in the quantum wells, which also leads to a stronger FX PL peak intensity in comparison with BX at 10 K. Si-doping is found to suppress the FX quenching by reducing threading dislocation density (TDD) in the well layers, leading to a significant improvement of IQE from 33.7% to 45%.

Generation of Rashba spin-orbit coupling in CdSe nanowire by ionic liquid gate.

Spintronic devices rely on the spin degree of freedom (DOF), and spin orbit coupling (SOC) is the key to manipulate spin DOF. Quasi-one-dimensional structures, possessing marked anisotropy gives more choice for the manipulation of the spin DOF since the concrete SOC form varies along with crystallographic directions. The anisotropy of the Dresselhaus SOC in cadmium selenide (CdSe) nanobelt and nanowire was studied by circular photogalvanic effect. It was demonstrated that the Dresselhaus SOC parameter is zero along the [0001] crystallographic direction, which suppresses the spin relaxation and increases the spin diffusion length, and thus is beneficial to the spin manipulation. To achieve a device structure with Rashba SOC presence and Dresselhaus SOC absence for manipulating the spin DOF, an ionic liquid gate was produced on a nanowire grown along the [0001] crystallographic direction, and the Rashba SOC was induced by gating, as expected.

Effect of injection current on the optical polarization of AlGaN-based ultraviolet light-emitting diodes.

The injection current dependence of optical polarization of ultraviolet (UV) light-emitting diodes (LEDs) emitting at wavelength of 310 nm and 277 nm was investigated by electroluminescence (EL) measurements. For both diodes, it was found that the degree of polarization (DOP) decreased obviously as the injection current increased. We attribute the decrease in DOP to the different changing trend of the intensity of the light emission from transverse electric (TE) polarization (E⊥c) and transverse magnetic (TM) polarization (E∥c) as the injected carriers occupy higher states above k = 0 with increasing the injection current. For the 277 nm LED, even the polarization switching from TE to TM mode was observed.

Strain effect on the optical polarization properties of c-plane Al0.26Ga0.74N/GaN superlattices.

A new approach to realize ultraviolet (UV) light emitting diodes (LEDs) is using AlN/GaN or AlxGa1-xN/GaN SL structure as active layers. Effect of a uniaxial strain on the degree of polarization (DOP) of Al0.26Ga0.74N/GaN superlattices (SLs) grown on c-plane sapphire substrates has been investigated. Compared with AlN/AlxGa1-xN quantum wells, the DOP of the light emission from Al0.26Ga0.74N/GaN SLs shows an opposite variation tendency with in-plane strain and quantum confinement. The results would be helpful to the structural design of c-plane deep-UV and UVA LEDs to enhance surface emission.

Improving quality of experience in m-health monitoring system.

Quality of Experience (QoE) is proposed to evaluate user's overall satisfaction with the network system and services. For m-health systems, improving QoE means starting from user's view to make patients and doctors (the main users of m-health system who are especially captious to services related to health) to achieve best satisfaction. In this paper, we proposed an improved model for QoE of m-health systems based on energy consumption and information integrity received by the users, and then explore on how the users' satisfaction with m-health systems' energy consumption and received information integrity by exponential formula, which is influenced by the quantity of the transmitted information. Finally, from the results of simulation, we concluded that the appropriate compression of information quantity is the best way to improve QoE performance of the m-health system.

Optical investigation of strong exciton localization in high Al composition AlxGa1-xN alloys.

The exciton localization in wurtzite AlxGa1-xN alloys with x varying from 0.41 to 0.63 has been studied by deep-ultraviolet photoluminescence (PL) spectroscopy and picosecond time-resolved PL spectroscopy. Obvious S-shape temperature dependence was observed indicating that the strong exciton localization can be formed in high Al composition AlxGa1-xN alloys. It was also found that the Al composition dependence of exciton localization energy of AlGaN alloys is inconsistent with that of the excitonic linewidth. We contribute the inconsistency to the strong zero-dimensional exciton localization.