Simple and Efficient AlN-Based Piezoelectric Energy Harvesters.

In this work, we demonstrate the simple fabrication process of AlN-based piezoelectric energy harvesters (PEH), which are made of cantilevers consisting of a multilayer ion beam-assisted deposition. The preferentially (001) orientated AlN thin films possess exceptionally high piezoelectric coefficients d33 of (7.33 ± 0.08) pC∙N-1. The fabrication of PEH was completed using just three lithography steps, conventional silicon substrate with full control of the cantilever thickness, in addition to the thickness of the proof mass. As the AlN deposition was conducted at a temperature of ≈330 °C, the process can be implemented into standard complementary metal oxide semiconductor (CMOS) technology, as well as the CMOS wafer post-processing. The PEH cantilever deflection and efficiency were characterized using both laser interferometry, and a vibration shaker, respectively. This technology could become a core feature for future CMOS-based energy harvesters.

Comparison of three focus sensors for optical topography measurement of rough surfaces.

The study compares three variants of focus sensors designed for the optical topography measurement of rough surface specimens with submicron accuracy. We present a theoretical analysis of the focus sensor principles and the experimental measurements with a single point laser probe. A low coherent illumination beam was provided by a monochromatic laser source and a rotating diffuser, which reduced the speckles generated by the rough surface. The reflected beam was modulated by three specific optical elements (axicon, double wedge prism, four spherical lenses) realized by a spatial light modulator. A digital camera detected the output intensity patterns that were evaluated by the intensity centroid method. The results showed a good coincidence of the surface profiles obtained by the three sensor variants with the root-mean-square deviations below one micron. We discuss the results obtained for several specimens with various surface roughness and compare the differences between the three focus sensor variants.

Influence of coating technology and thermal annealing on the optical performance of AR coatings in iodine-filled absorption cells.

In this contribution, we investigate the properties of antireflective coatings on iodine-filled absorption cell windows. These coatings are subject to high temperatures during the cell production process and are in direct contact with the absorption medium, which influences their optical performance. We tested the thermal resistance of TiO2- and Ta2O5- based coatings produced using conventional electron beam evaporation (e-beam) and ion-assisted deposition (PIAD). We prepared a set of iodine-filled absorption cells that were used to test the coatings' resistance to iodine vapors. We show that the choice of coating materials, coating methods, and a well-chosen bakeout procedure can mitigate any unwanted effects, such as temperature-induced spectral shifts and optical losses inhomogeneities or settling of the absorption medium in the coating.

Iodine Absorption Cells Purity Testing.

This article deals with the evaluation of the chemical purity of iodine-filled absorption cells and the optical frequency references used for the frequency locking of laser standards. We summarize the recent trends and progress in absorption cell technology and we focus on methods for iodine cell purity testing. We compare two independent experimental systems based on the laser-induced fluorescence method, showing an improvement of measurement uncertainty by introducing a compensation system reducing unwanted influences. We show the advantages of this technique, which is relatively simple and does not require extensive hardware equipment. As an alternative to the traditionally used methods we propose an approach of hyperfine transitions' spectral linewidth measurement. The key characteristic of this method is demonstrated on a set of testing iodine cells. The relationship between laser-induced fluorescence and transition linewidth methods will be presented as well as a summary of the advantages and disadvantages of the proposed technique (in comparison with traditional measurement approaches).

Self-referenced interferometer for cylindrical surfaces.

We present a new interferometric method for shape measurement of hollow cylindrical tubes. We propose a simple and robust self-referenced interferometer where the reference and object waves are represented by the central and peripheral parts, respectively, of the conical wave generated by a single axicon lens. The interferogram detected by a digital camera is characterized by a closed-fringe pattern with a circular carrier. The interference phase is demodulated using spatial synchronous detection. The capabilities of the interferometer are experimentally tested for various hollow cylindrical tubes with lengths up to 600 mm.

Spectral properties of molecular iodine in absorption cells filled to specified saturation pressure.

We present the results of measurement and evaluation of spectral properties of iodine absorption cells filled at certain saturation pressure. A set of cells made of borosilicate glass instead of common fused silica was tested for their spectral properties in greater detail with special care for the long-term development of the absorption media purity. The results were compared with standard fused silica cells and the high quality of iodine was verified. A measurement method based on an approach relying on measurement of linewidth of the hyperfine transitions is proposed as a novel technique for iodine cell absorption media purity evaluation. A potential application in laser metrology of length is also discussed.

Frequency noise properties of lasers for interferometry in nanometrology.

In this contribution we focus on laser frequency noise properties and their influence on the interferometric displacement measurements. A setup for measurement of laser frequency noise is proposed and tested together with simultaneous measurement of fluctuations in displacement in the Michelson interferometer. Several laser sources, including traditional He-Ne and solid-state lasers, and their noise properties are evaluated and compared. The contribution of the laser frequency noise to the displacement measurement is discussed in the context of other sources of uncertainty associated with the interferometric setup, such as, mechanics, resolution of analog-to-digital conversion, frequency bandwidth of the detection chain, and variations of the refractive index of air.

Refractive index compensation in over-determined interferometric systems.

We present an interferometric technique based on a differential interferometry setup for measurement under atmospheric conditions. The key limiting factor in any interferometric dimensional measurement are fluctuations of the refractive index of air representing a dominating source of uncertainty when evaluated indirectly from the physical parameters of the atmosphere. Our proposal is based on the concept of an over-determined interferometric setup where a reference length is derived from a mechanical frame made from a material with a very low thermal coefficient. The technique allows one to track the variations of the refractive index of air on-line directly in the line of the measuring beam and to compensate for the fluctuations. The optical setup consists of three interferometers sharing the same beam path where two measure differentially the displacement while the third evaluates the changes in the measuring range, acting as a tracking refractometer. The principle is demonstrated in an experimental setup.

Displacement interferometry with stabilization of wavelength in air.

We present a concept of suppression of the influence of variations of the refractive index of air in displacement measuring interferometry. The principle is based on referencing of wavelength of the coherent laser source in atmospheric conditions instead of traditional stabilization of the optical frequency and indirect evaluation of the refractive index of air. The key advantage is in identical beam paths of the position measuring interferometers and the interferometer used for the wavelength stabilization. Design of the optical arrangement presented here to verify the concept is suitable for real interferometric position sensing in technical practice especially where a high resolution measurement within some limited range in atmospheric conditions is needed, e.g. in nanometrology.