Enhancing performance in the presence of outliers with redescending M-estimators.

In real-life situations, we have to analyze the data that contains the atypical observations, and the presence of outliers has adverse effects on the performance of ordinary least square estimates. In this situation, redescedning M-estimators, proposed by Huber (1964), are used to tackle the effects of outliers to increase the efficiency of least square estimates. In this study, we introduce a redescending M-estimator designed to generate robust estimates by mitigating the influence of outlier observations, even when the tuning constant is set to low values. This innovative estimator exhibits enhanced linearity at its core and maintains continuity throughout its range. Our proposed estimator stands out for its novelty, simplicity, differentiability, and practical applicability across real-world scenarios. The results of the proposed redescedning M-estimators are compared with existing robust estimators using an extensive simulation study. Two examples based on real-life data are also added to validate the performance of the suggested function. The formulated redescedning M-estimator produced efficient results as compared to all the considered redescedning M-estimators.

Max-mixed EWMA control chart for joint monitoring of mean and variance: an application to yogurt packing process.

The Max-Mixed EWMA Exponentially Weighted Moving Average (MM EWMA) control chart is a statistical process control technique used for joint monitoring of the mean and variance of a process. This control chart is designed to detect small and moderate shifts in the mean and variance of a process by comparing the maximum of two statistics, one based on the mean and the other on the variance. In this paper, we propose a new MM EWMA control chart. The proposed chart is compared with existing control charts using simulation studies, and the results show that the chart performs better in detecting small and moderate shifts in both the mean and variance. The proposed chart can be helpful in quality control applications, where joint monitoring of mean and variance is necessary to ensure a product's or process's quality. The real-life application of the proposed control chart on yogurt packing in a cup data set shows the outperformance of the MM EWMA control chart. Both simulations & real-life application results demonstrate the better performance of the proposed chart in detecting smaller shifts during the production process.

Risk adjusted EWMA control chart based on support vector machine with application to cardiac surgery data.

In the current study, we demonstrate the use of a quality framework to review the process for improving the quality and safety of the patient in the health care department. The researchers paid attention to assessing the performance of the health care service, where the data is usually heterogeneous to patient's health conditions. In our study, the support vector machine (SVM) regression model is used to handle the challenge of adjusting the risk factors attached to the patients. Further, the design of exponentially weighted moving average (EWMA) control charts is proposed based on the residuals obtained through SVM regression model. Analyzing real cardiac surgery patient data, we employed the SVM method to gauge patient condition. The resulting SVM-EWMA chart, fashioned via SVM modeling, revealed superior shift detection capabilities and demonstrated enhanced efficacy compared to the risk-adjusted EWMA control chart.

An adaptive Bayesian approach for improved sensitivity in joint monitoring of mean and variance using Max-EWMA control chart.

This article introduces an adaptive approach within the Bayesian Max-EWMA control chart framework. Various Bayesian loss functions were used to jointly monitor process deviations from the mean and variance of normally distributed processes. Our study proposes the mechanism of using a function-based adaptive method that picks self-adjusting weights incorporated in Bayesian Max-EWMA for the estimation of mean and variance. This adaptive mechanism significantly enhances the effectiveness and sensitivity of the Max-EWMA chart in detecting process shifts in both the mean and dispersion. The Monte Carlo simulation technique was used to calculate the run-length profiles of different combinations. A comparative performance analysis with an existing chart demonstrates its effectiveness. A practical example from the hard-bake process in semiconductor manufacturing is presented for practical context and illustration of the chart settings and performance. The empirical results showcase the superior performance of the Adaptive Bayesian Max-EWMA control chart in identifying out-of-control signals. The chart's ability to jointly monitor the mean and variance of a process, its adaptive nature, and its Bayesian framework make it a useful and effective control chart.

A support vector machine based drought index for regional drought analysis.

The increased global warming has increased the likelihood of recurrent drought hazards. Potential links between the frequency of extreme weather events and global warming have been suggested by earlier research. The spatial variability of meteorological factors over short distances can cause distortions in conclusions or limit the scope of drought analysis in a particular region when extreme values predominate. Therefore, it is challenging to make trustworthy judgments regarding the spatiotemporal characteristics of regional drought. This study aims to improve the quality and accuracy of regional drought characterization and the process of continuous monitoring. The new drought indicator presented in this study is called the Support Vector Machine based drought index (SVM-DI). It is created by adding different weights to an SVM-based X-bar chart that is displayed with regional precipitation aggregate data. The SVM-DI application site is located in Pakistan's northern area. Using the Pearson correlation coefficient for pairwise comparison, the study compares the SVM-DI and the Regional Standard Precipitation Index (RSPI). Interestingly, compared to RSPI, SVM-DI shows more pronounced regional characteristics in its correlations with other meteorological stations, with a significantly lower Coefficient of Variation. These results confirm that SVM-DI is a useful tool for regional drought analysis. The SVM-DI methodology offers a unique way to reduce the impact of extreme values and outliers when aggregating regional precipitation data.

A redescending M-estimator approach for outlier-resilient modeling.

The OLS model is built on the assumption of normality in the distribution of error terms. However, this assumption can be easily violated, especially when there are outliers in the data. A single outlier can disrupt the normality assumption of error terms, making the OLS model less effective. In such situations, M-estimators (MEs) come into play to obtain reliable estimates. We introduce a redescending M-estimators (RME) for robust regression to handle datasets with outliers. The proposed RME produces more robust estimates by effectively managing the influence of outliers, even at lower values of the tuning constant. We compared the performance of this estimator with existing RMEs using real-life data examples and an extensive simulation study. The results show that our suggested RME is more efficient than the compared ME in various situations.

Memory type Max-EWMA control chart for the Weibull process under the Bayesian theory.

The simultaneous monitoring of both process mean and dispersion, particularly in normal processes, has garnered significant attention within the field. In this article, we present a new Bayesian Max-EWMA control chart that is intended to track a non-normal process mean and dispersion simultaneously. This is accomplished through the utilization of the inverse response function, especially in cases where the procedure follows a Weibull distribution. We used the average run length (ARL) and the standard deviation of run length (SDRL) to assess the efficacy of our suggested control chart. Next, we contrast our suggested control chart's performance with an already-existing Max-EWMA control chart. Our results show that compared to the control chart under consideration, the proposed control chart exhibits a higher degree of sensitivity. Finally, we present a useful case study centered around the hard-bake process in the semiconductor manufacturing sector to demonstrate the performance of our Bayesian Max-EWMA control chart under different Loss Functions (LFs) for a Weibull process. The case study highlights how flexible the chart is to various situations. Our results offer strong proof of the outstanding ability of the Bayesian Max-EWMA control chart to quickly identify out-of-control signals during the hard-bake procedure. This in turn significantly contributes to the enhancement of process monitoring and quality control.

A novel Bayesian Max-EWMA control chart for jointly monitoring the process mean and variance: an application to hard bake process.

In this article, we introduce a novel Bayesian Max-EWMA control chart under various loss functions to concurrently monitor the mean and variance of a normally distributed process. The Bayesian Max-EWMA control chart exhibit strong overall performance in detecting shifts in both mean and dispersion across various magnitudes. To evaluate the performance of the proposed control chart, we employ Monte Carlo simulation methods to compute their run length characteristics. We conduct an extensive comparative analysis, contrasting the run length performance of our proposed charts with that of existing ones. Our findings highlight the heightened sensitivity of Bayesian Max-EWMA control chart to shifts of diverse magnitudes. Finally, to illustrate the efficacy of our Bayesian Max-EWMA control chart using various loss functions, we present a practical case study involving the hard-bake process in semiconductor manufacturing. Our results underscore the superior performance of the Bayesian Max-EWMA control chart in detecting out-of-control signals.

Monitoring of semiconductor manufacturing process on Bayesian AEWMA control chart under paired ranked set sampling schemes.

Quality control often employs memory-type control charts, including the exponentially weighted moving average (EWMA) and Shewhart control charts, to identify shifts in the location parameter of a process. This article pioneers a new Bayesian Adaptive EWMA (AEWMA) control chart, built on diverse loss functions (LFs) such as the square error loss function (SELF) and the Linex loss function (LLF). The proposed chart aims to enhance the process of identifying small to moderate as well as significant shifts in the mean, signifying a notable advancement in the field of quality control. These are implemented utilizing an informative prior for both posterior and posterior predictive distributions, employing various paired ranked set sampling (PRSS) schemes. The effectiveness of the suggested chart is appraised using average run length (ARL) and the standard deviation of run length (SDRL). Monte Carlo simulations are employed to contrast the recommended approach against other control charts. The outcomes demonstrate the dignitary performance of the recommended chart in identifying out-of-control signals, especially applying PRSS designs, in comparison to simple random sampling (SRS). Finally, a practical application was conducted in the semiconductor manufacturing context to appraise the efficacy of the offered chart using various paired ranked set sampling strategies. The results reveal that the suggested control chart performed well in capturing the out-of-control signals far better than the already in use control charts. Overall, this study interposes a new technique with diverse LFs and PRSS designs, improving the precision and effectiveness in detecting process mean shifts, thereby contributing to advancements in quality control and process monitoring.

A Weibull process monitoring with AEWMA control chart: an application to breaking strength of the fibrous composite.

In recent times, there has been a growing focus among researchers on memory-based control charts. The Exponentially Weighted Moving Average (EWMA) and Cumulative Sum (CUSUM) charts and the adaptive control charting approaches got the attention. Control charts are commonly employed to oversee processes, assuming the monitored variable follows a normal distribution. However, it's worth noting that this assumption does not hold true in many real-world situations. The use of the algebraic expression for normalization, which can be used for all kinds of skewed distributions with a closed-form distribution function, using the proposed continuous function to adapt a smoothing constant, motivates this study. In the present manuscript, we design an EWMA statistic-based adaptive control chart to monitor the irregular variations in the mean of two parametric Weibull distribution and use Hasting approximation for normalization. The adaptive control charts are used to update the smoothing constant according to the estimated shift. Here we use the proposed continuous function to adapt the smoothing constant. The average run length and standard deviation of run length are calculated under different parameter settings. The effectiveness of the proposed chart is argued in terms of ARLs over the considered EWMA chart through Monte-Carlo (MC) simulation method. The proposed chart is examined, followed by a real data set to demonstrate the design and application procedures.

Bayesian AEWMA control chart under ranked set sampling with application to reliability engineering.

The article introduces a novel Bayesian AEWMA Control Chart that integrates different loss functions (LFs) like the square error loss function and Linex loss function under an informative prior for posterior and posterior predictive distributions, implemented across diverse ranked set sampling (RSS) designs. The main objective is to detect small to moderate shifts in the process mean, with the average run length and standard deviation of run length serving as performance measures. The study employs a hard bake process in semiconductor production to demonstrate the effectiveness of the proposed chart, comparing it with existing control charts through Monte Carlo simulations. The results underscore the superiority of the proposed approach, particularly under RSS designs compared to simple random sampling (SRS), in identifying out-of-control signals. Overall, this study contributes a comprehensive method integrating various LFs and RSS schemes, offering a more precise and efficient approach for detecting shifts in the process mean. Real-world applications highlight the heightened sensitivity of the suggested chart in identifying out-of-control signals compared to existing Bayesian charts using SRS.

Monitoring the process mean under the Bayesian approach with application to hard bake process.

This study introduces the Bayesian adaptive exponentially weighted moving average (AEWMA) control chart within the framework of measurement error, examining two separate loss functions: the squared error loss function and the linex loss function. We conduct an analysis of the posterior and posterior predictive distributions utilizing a conjugate prior. In the presence of measurement error (ME), we employ a linear covariate model to assess the control chart's effectiveness. Additionally, we explore the impacts of measurement error by investigating multiple measurements and a method involving linearly increasing variance. We conduct a Monte Carlo simulation study to assess the control chart's performance under ME, examining its run length profile. Subsequently, we offer a specific numerical instance related to the hard-bake process in semiconductor manufacturing, serving to verify the functionality and practical application of the suggested Bayesian AEWMA control chart when confronted with ME.

Adaptive multivariate dispersion control chart with application to bimetal thermostat data.

Adaptive EWMA (AEWMA) control charts have gained remarkable recognition by monitoring productions over a wide range of shifts. The adaptation of computational statistic as per system shift is the main aspect behind the proficiency of these charts. In this paper, a function-based AEWMA multivariate control chart is suggested to monitor the stability of the variance-covariance matrix for normally distributed process control. Our approach involves utilizing an unbiased estimator applying the EWMA statistic to estimate the process shift in real-time and adapt the smoothing or weighting constant using a suggested continuous function. Preferably, the Monte Carlo simulation method is utilized to determine the characteristics of the suggested AEWMA chart in terms of proficient detection of process shifts. The underlying computed results are compared with existing EWMA and existing AEWMA charts and proved to outperform in providing quick detection for different sizes of shifts. To illustrate its real-life application, the authors employed the concept in the bimetal thermostat industry dataset. The proposed research contributes to statistical process control and provides a practical tool for the solution while monitoring covariance matrix changes.

Adaptive EWMA control chart for monitoring the coefficient of variation under ranked set sampling schemes.

In this study, we introduce an Adaptive Exponentially Weighted Moving based Coefficient of Variation (AEWMCV) control chart, designed to address situations where the process mean fluctuates over time and the standard deviation of the process changes linearly with the process mean. To enhance the efficiency and effectiveness of the control chart, we integrate the ranked set sampling method and its modified schemes, such as Simple Random Sampling, Quartile RSS, Median RSS, and Extreme RSS. The performance of the proposed AEWMCV control chart and the studied CV control charts are evaluated using the Average Run Length and Standard Deviation of Run Length metrics. Our findings reveal that the proposed control chart outperforms the existing CV control charts, especially in detecting slight to moderate changes in the process CV. To illustrate the practical applicability of the suggested control chart, we present an example demonstrating its use on a real dataset. The results highlight the superior performance of the AEWMCV control chart in accurately detecting and responding to changes in the process CV. In conclusion, our study introduces an innovative AEWMCV control chart that combines ranked set sampling and its modified schemes to enhance performance in scenarios with fluctuating process means and changing standard deviations. The proposed control chart proves to be more effective in detecting subtle variations in the process CV compared to traditional CV control charts. This research provides a valuable contribution to the field of control chart methodology, especially when dealing with challenging or costly data collection scenarios.

Monitoring of manufacturing process using bayesian EWMA control chart under ranked based sampling designs.

Control charts, including exponentially moving average (EWMA) , are valuable for efficiently detecting small to moderate shifts. This study introduces a Bayesian EWMA control chart that employs ranked set sampling (RSS) with known prior information and two distinct loss functions (LFs), the Square Error Loss function (SELF) and the Linex Loss function (LLF), for posterior and posterior predictive distributions. The chart's performance is assessed using average run length (ARL) and standard deviation of run length (SDRL) profiles, and it is compared to the Bayesian EWMA control chart based on simple random sampling (SRS). The results indicate that the proposed control chart detects small to moderate shifts more effectively. The application in semiconductor manufacturing provides concrete evidence that the Bayesian EWMA control chart, when implemented with RSS schemes, demonstrates a higher degree of sensitivity in detecting deviations from normal process behavior. Comparison to the Bayesian EWMA control chart using SRS, it exhibits a superior ability to identify and flag instances where the manufacturing process is going out of control. This heightened sensitivity is critical for promptly addressing and rectifying issues, which ultimately contributes to improved quality control in semiconductor production.

Performance of Bayesian EWMA control chart with measurement error under ranked set sampling schemes with application in industrial engineering.

The objective of this study is to investigate the behavior of the Bayesian exponentially weighted moving average (EWMA) control chart in the presence of measurement error (ME). It explores the impact of different ranked set sampling designs and loss functions on the performance of the control chart when ME is present. The analysis incorporates a covariate model, multiple measurement methods, and a conjugate prior to account for ME. The performance evaluation of the proposed Bayesian EWMA control chart with ME includes metrics such as average run length and standard deviation of run lengths. The findings, obtained through Monte Carlo simulation and real data application, indicated that ME significantly affects the performance of the Bayesian EWMA control chart when RSS schemes are employed. Particularly noteworthy is the superior performance of the median RSS scheme compared to the other two schemes in the presence of ME.

Combination of memory type ratio and product estimators under extended EWMA statistic with application to wheat production.

The extended exponential weighted moving average (EEWMA) statistic is a memory type statistic that uses past observations along with the current information for the estimation of a population parameter to improve the efficiency of the estimators. This study utilized the EEWMA statistic to estimate the population mean with a suitable auxiliary variable. The ratio and product estimators are proposed for the surveys that are time-based by using current information along with that information. The approximate mean square errors are computed for the proposed memory type estimators and mathematical comparison is discussed to demonstrate the efficiency of the estimator. The simulation study was carried out to evaluate the performance of the proposed memory type estimators. It can be seen from the results that the efficiency of the estimator enhances by utilizing the current sample as well as past information. A real-life example is presented to illustrate the usage of proposed estimators.

Adaptive EWMA control chart using Bayesian approach under ranked set sampling schemes with application to Hard Bake process.

The memory-type control charts, such as cumulative sum (CUSUM) and exponentially weighted moving average control chart, are more desirable for detecting a small or moderate shift in the production process of a location parameter. In this article, a novel Bayesian adaptive EWMA (AEWMA) control chat utilizing ranked set sampling (RSS) designs is proposed under two different loss functions, i.e., square error loss function (SELF) and linex loss function (LLF), and with informative prior distribution to monitor the mean shift of the normally distributed process. The extensive Monte Carlo simulation method is used to check the performance of the suggested Bayesian-AEWMA control chart using RSS schemes. The effectiveness of the proposed AEWMA control chart is evaluated through the average run length (ARL) and standard deviation of run length (SDRL). The results indicate that the proposed Bayesian control chart applying RSS schemes is more sensitive in detecting mean shifts than the existing Bayesian AEWAM control chart based on simple random sampling (SRS). Finally, to demonstrate the effectiveness of the proposed Bayesian-AEWMA control chart under different RSS schemes, we present a numerical example involving the hard-bake process in semiconductor fabrication. Our results show that the Bayesian-AEWMA control chart using RSS schemes outperforms the EWMA and AEWMA control charts utilizing the Bayesian approach under simple random sampling in detecting out-of-control signals.

Applicability of modified weibull extension distribution in modeling censored medical datasets: a bayesian perspective.

There are some contributions analyzing the censored medical datasets using modifications of the conventional lifetime distribution; however most of the said contributions did not considered the modification of the Weibull distribution (WD). The WD is an important lifetime model. Due to its prime importance in modeling life data, many researchers have proposed different modifications of WD. One of the most recent modifications of WD is Modified Weibull Extension distribution (MWED). However, the ability of MWED to model the censored medical data has not yet been explored in the literature. We have explored the suitability of the model in modeling censored medical datasets. The analysis has been carried out using Bayesian methods under different loss functions and informative priors. The approximate Bayes estimates have been computed using Lindley's approximation. Based on detailed simulation study and real life analysis, it has been concluded that Bayesian methods performed better as compared to maximum likelihood estimates. In case of small samples, the performance of Bayes estimates under ELF and informative prior was the best. However, in case of large samples, the choice of prior and loss function did not affect the efficiency of the results to a large extend. The MWED performed efficiently in modeling real censored datasets relating to survival times of the leukemia and bile duct cancer patients. The MWED was explored to be a very promising candidate model for modeling censored medical datasets.