XRF calibration with low-cost samples and implementation for quantification of inorganic elements in lipsticks.

In this paper, the preparation of low-cost samples, for the calibration of an energy-dispersive X-ray fluorescence system is presented. The entire procedure is proposed as an undergraduate or postgraduate student laboratory activity, which aims to familiarize students with the procedure of calibration of a spectroscopy-based analytical method through the XRF technique. Furthermore, the use of XRF for the determination of elemental concentrations in samples related to students' interests, was attempted.

Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM.

Cross correlation based high angular resolution EBSD (or HR-EBSD) has been developed for measurement of elastic strains, lattice rotations (and estimating GND density). Recent advances in Transmission Kikuchi diffraction (TKD), especially the on-axis geometry allows the possibility of acquiring patterns at higher spatial resolution. However, some controversy remains as to whether stresses/strains measured after the sample thinning process are still representative of the bulk sample. In this paper, we explore a way of applying the HR-EBSD method to study strains and lattice rotations in an initially bulk sample, that is then progressively thinned down until a similar analysis can be performed on thin (and electron transparent) samples. Thus, HR-TKD will be compared as a possible alternative to HR-EBSD, in scenarios when it is not always possible to perform EBSD on the surface of the sample. An estimate of strain relaxation in the sample as a result of sample thinning is presented.

Enhanced contrast separation in scanning electron microscopes via a suspended-thin sample approach.

A suspended-thin-sample (STS) approach for signal selection and contrast separation is developed in scanning electron microscopes with commonly used primary beam energies and traditional detectors. Topography contrast, electron channeling contrast and composition contrast are separated and largely enhanced from suspended thin samples of several hundred nanometers in thickness, which is less than the escape depth of backscattered electrons. This imaging technique enables to detect relatively pure secondary electron and elastic backscattered electron singles, whereas suppress multiple inelastic scattering effects. The provided contrast features are different from those of bulk samples, which are largely mixed with inelastic scattering effects. The STS imaging concept and method could be expected to have more applications in distinguishing materials of nanostructures, multilayers, compounds and composites, as well as in SEM-based electron backscatter diffraction, cathodoluminesence, and x-ray microanalysis.