Relative measurements of second-order susceptibility with reflective second-harmonic generation.
Appl Opt
; 42(33): 6666-71, 2003 Nov 20.
Article
en En
| MEDLINE
| ID: mdl-14658470
ABSTRACT
There is a strong demand for a simple and reliable technique for second-order susceptibility measurements of thin films. Since the Maker fringe technique is limited to transparent substrates we propose an experimental protocol based on reflective second-harmonic generation (SHG). The proposed protocol is based on relative measurements of Z-cut quartz. An analytical expression of the reflective SHG intensity dependence of the polarizer, analyzer, and sample azimuth is presented. An error analysis is also presented. Thin organic film of the side-chain polymer poly(Disperse Red 1 Methacrylate-Co-Methyl-Methacrylate) is investigated. Results for different wavelengths are reported.
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Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Appl Opt
Año:
2003
Tipo del documento:
Article
País de afiliación:
Canadá