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On the origin of visibility contrast in x-ray Talbot interferometry.
Yashiro, W; Terui, Y; Kawabata, K; Momose, A.
Afiliación
  • Yashiro W; Department of Advanced Materials Science, Graduate School of Frontier Sciences, the University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan. yashiro@mml.k.u-tokyo.ac.jp
Opt Express ; 18(16): 16890-901, 2010 Aug 02.
Article en En | MEDLINE | ID: mdl-20721081
ABSTRACT
The reduction in visibility in x-ray grating interferometry based on the Talbot effect is formulated by the autocorrelation function of spatial fluctuations of a wavefront due to unresolved micron-size structures in samples. The experimental results for microspheres and melamine sponge were successfully explained by this formula with three parameters characterizing the wavefront fluctuations variance, correlation length, and the Hurst exponent. The ultra-small-angle x-ray scattering of these samples was measured, and the scattering profiles were consistent with the formulation. Furthermore, we discuss the relation between the three parameters and the features of the micron-sized structures. The visibility-reduction contrast observed by x-ray grating interferometry can thus be understood in relation to the structural parameters of the microstructures.
Asunto(s)

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Dispersión de Radiación / Triazinas / Rayos X / Microesferas Idioma: En Revista: Opt Express Asunto de la revista: OFTALMOLOGIA Año: 2010 Tipo del documento: Article País de afiliación: Japón

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Dispersión de Radiación / Triazinas / Rayos X / Microesferas Idioma: En Revista: Opt Express Asunto de la revista: OFTALMOLOGIA Año: 2010 Tipo del documento: Article País de afiliación: Japón
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