Your browser doesn't support javascript.
loading
Thermally triggered degradation of transient electronic devices.
Park, Chan Woo; Kang, Seung-Kyun; Hernandez, Hector Lopez; Kaitz, Joshua A; Wie, Dae Seung; Shin, Jiho; Lee, Olivia P; Sottos, Nancy R; Moore, Jeffrey S; Rogers, John A; White, Scott R.
Afiliación
  • Park CW; Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Kang SK; Department of Materials Science and Engineering, Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Hernandez HL; Department of Mechanical Science and Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Kaitz JA; Department of Chemistry Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Wie DS; Department of Materials Science and Engineering, Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Shin J; Department of Chemical and Biomolecular Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Lee OP; Department of Chemistry Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Sottos NR; Department of Materials Science and Engineering Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Moore JS; Department of Chemistry Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
  • Rogers JA; Department of Materials Science and Engineering, Chemistry, Mechanical Science and Engineering Electrical and Computer Engineering, Beckman Institute for Advanced Science and Technology, and Frederick Seitz Materials, Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, 61801
  • White SR; Department of Aerospace Engineering Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA.
Adv Mater ; 27(25): 3783-8, 2015 Jul 01.
Article en En | MEDLINE | ID: mdl-25991389
Asunto(s)
Palabras clave
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Temperatura / Ácidos / Ceras / Equipos y Suministros Eléctricos / Metales Idioma: En Revista: Adv Mater Asunto de la revista: BIOFISICA / QUIMICA Año: 2015 Tipo del documento: Article País de afiliación: Estados Unidos
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Temperatura / Ácidos / Ceras / Equipos y Suministros Eléctricos / Metales Idioma: En Revista: Adv Mater Asunto de la revista: BIOFISICA / QUIMICA Año: 2015 Tipo del documento: Article País de afiliación: Estados Unidos