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Effects of thermally-induced changes of Cu grains on domain structure and electrical performance of CVD-grown graphene.
Wu, Yaping; Hao, Yufeng; Fu, Mingming; Jiang, Wei; Wu, Qingzhi; Thrower, Peter A; Piner, Richard D; Ke, Congming; Wu, Zhiming; Kang, Junyong; Ruoff, Rodney S.
Afiliación
  • Wu Y; Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen 361005, P. R. China. jykang@xmu.edu.cn and Department of Mechanical Engineering and the Mater
  • Hao Y; Department of Mechanical Engineering and the Materials Science and Engineering Program, The University of Texas at Austin, Austin, Texas 78712, USA. yh2682@columbia.edu ruofflab@gmail.com and Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA.
  • Fu M; Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen 361005, P. R. China. jykang@xmu.edu.cn.
  • Jiang W; Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen 361005, P. R. China. jykang@xmu.edu.cn.
  • Wu Q; Department of Mechanical Engineering and the Materials Science and Engineering Program, The University of Texas at Austin, Austin, Texas 78712, USA. yh2682@columbia.edu ruofflab@gmail.com.
  • Thrower PA; Department of Materials Science and Engineering, the Pennsylvania State University, University Park, PA 16802, USA.
  • Piner RD; Department of Mechanical Engineering and the Materials Science and Engineering Program, The University of Texas at Austin, Austin, Texas 78712, USA. yh2682@columbia.edu ruofflab@gmail.com.
  • Ke C; Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen 361005, P. R. China. jykang@xmu.edu.cn.
  • Wu Z; Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen 361005, P. R. China. jykang@xmu.edu.cn.
  • Kang J; Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen 361005, P. R. China. jykang@xmu.edu.cn.
  • Ruoff RS; Department of Mechanical Engineering and the Materials Science and Engineering Program, The University of Texas at Austin, Austin, Texas 78712, USA. yh2682@columbia.edu ruofflab@gmail.com and Center for Multidimensional Carbon Materials and Department of Chemistry and School of Materials Science Uls
Nanoscale ; 8(2): 930-7, 2016 Jan 14.
Article en En | MEDLINE | ID: mdl-26660490

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2016 Tipo del documento: Article

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2016 Tipo del documento: Article
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