Setting up of in-vacuum PIXE system for direct elemental analysis of thick solid environmental samples.

Rihawy, M S; Ismail, I M; Halloum, D

Rihawy, M S; Ismail, I M; Halloum, D.

Afiliación

Rihawy MS; Department of Chemistry, Atomic Energy Commission, P.O. Box 6091, Damascus, Syrian Arab Republic. Electronic address: cscientific4@aec.org.sy.
Ismail IM; Department of Chemistry, Atomic Energy Commission, P.O. Box 6091, Damascus, Syrian Arab Republic.
Halloum D; Department of Chemistry, Atomic Energy Commission, P.O. Box 6091, Damascus, Syrian Arab Republic.

Appl Radiat Isot ; 110: 164-173, 2016 Apr.

Article en En | MEDLINE | ID: mdl-26803668

Palabras clave

Elemental analysis; Environmental samples; Ion beam analysis; TTPIXE

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Appl Radiat Isot Asunto de la revista: MEDICINA NUCLEAR / SAUDE AMBIENTAL Año: 2016 Tipo del documento: Article

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