Determining Projections of Grain Boundaries from Diffraction Data in Transmission Electron Microscope.

Kiss, Ákos K; Lábár, János L

Kiss, Ákos K; Lábár, János L.

Afiliación

Kiss ÁK; 1Hungarian Academy of Sciences,Research Center for Energy Research,Institute for Technical Physics and Materials Science (MTA EK MFA),Konkoly Thege M. út 29-33,H-1121 Budapest,Hungary.
Lábár JL; 1Hungarian Academy of Sciences,Research Center for Energy Research,Institute for Technical Physics and Materials Science (MTA EK MFA),Konkoly Thege M. út 29-33,H-1121 Budapest,Hungary.

Microsc Microanal ; 22(3): 551-64, 2016 06.

Article en En | MEDLINE | ID: mdl-27074103

Palabras clave

computer program; electron diffraction; grain boundary plane; non-negative matrix factorization; polycrystalline thin films

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2016 Tipo del documento: Article País de afiliación: Hungria

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