Introducing Overlapping Grain Boundaries in Chemical Vapor Deposited Hexagonal Boron Nitride Monolayer Films.

Bayer, Bernhard C; Caneva, Sabina; Pennycook, Timothy J; Kotakoski, Jani; Mangler, Clemens; Hofmann, Stephan; Meyer, Jannik C

Bayer, Bernhard C; Caneva, Sabina; Pennycook, Timothy J; Kotakoski, Jani; Mangler, Clemens; Hofmann, Stephan; Meyer, Jannik C.

Afiliación

Bayer BC; Faculty of Physics, University of Vienna , Boltzmanngasse 5, A-1090 Vienna, Austria.
Caneva S; Department of Engineering, University of Cambridge , 9 J.J. Thomson Avenue, CB3 0FA, Cambridge, U.K.
Pennycook TJ; Faculty of Physics, University of Vienna , Boltzmanngasse 5, A-1090 Vienna, Austria.
Kotakoski J; Faculty of Physics, University of Vienna , Boltzmanngasse 5, A-1090 Vienna, Austria.
Mangler C; Faculty of Physics, University of Vienna , Boltzmanngasse 5, A-1090 Vienna, Austria.
Hofmann S; Department of Engineering, University of Cambridge , 9 J.J. Thomson Avenue, CB3 0FA, Cambridge, U.K.
Meyer JC; Faculty of Physics, University of Vienna , Boltzmanngasse 5, A-1090 Vienna, Austria.

ACS Nano ; 11(5): 4521-4527, 2017 05 23.

Article en En | MEDLINE | ID: mdl-28410557

Palabras clave

2D materials; aberration-corrected scanning transmission electron microscopy; chemical vapor deposition; grain boundary; hexagonal boron nitride

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Nano Año: 2017 Tipo del documento: Article País de afiliación: Austria