Growth and characterization of textured well-faceted ZnO on planar Si(100), planar Si(111), and textured Si(100) substrates for solar cell applications.

Tsai, Chin-Yi; Lai, Jyong-Di; Feng, Shih-Wei; Huang, Chien-Jung; Chen, Chien-Hsun; Yang, Fann-Wei; Wang, Hsiang-Chen; Tu, Li-Wei

Tsai, Chin-Yi; Lai, Jyong-Di; Feng, Shih-Wei; Huang, Chien-Jung; Chen, Chien-Hsun; Yang, Fann-Wei; Wang, Hsiang-Chen; Tu, Li-Wei.

Afiliación

Tsai CY; Department of Applied Physics, National University of Kaohsiung, No.700, Kaohsiung University Road, Nanzih Dist., Kaohsiung 811, Taiwan, R.O.C.
Lai JD; Department of Applied Physics, National University of Kaohsiung, No.700, Kaohsiung University Road, Nanzih Dist., Kaohsiung 811, Taiwan, R.O.C.
Feng SW; Department of Applied Physics, National University of Kaohsiung, No.700, Kaohsiung University Road, Nanzih Dist., Kaohsiung 811, Taiwan, R.O.C.
Huang CJ; Department of Applied Physics, National University of Kaohsiung, No.700, Kaohsiung University Road, Nanzih Dist., Kaohsiung 811, Taiwan, R.O.C.
Chen CH; Green Energy and Environment Research Labs, Industrial Technology Research Institute, Hsinchu, Taiwan, R.O.C.
Yang FW; Department of Electronic Engineering, Southern Taiwan University of Science and Technology, Tainan, Taiwan, R.O.C.
Wang HC; Graduate Institute of Opto-Mechatronics, National Chung Cheng University, Chia-yi, Taiwan, R.O.C.
Tu LW; Department of Physics and Center for Nanoscience and Nanotechnology, National Sun Yat-Sen University, Kaohsiung, Taiwan, R.O.C.

Beilstein J Nanotechnol ; 8: 1939-1945, 2017.

Article en En | MEDLINE | ID: mdl-29046841

Palabras clave

X-ray diffraction; ZnO; atomic force microscopy; cathode luminescence; scanning electron microscopy; silicon solar cells; transparent conducting oxide

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Beilstein J Nanotechnol Año: 2017 Tipo del documento: Article