Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy.

Kakko, Joona-Pekko; Matikainen, Antti; Anttu, Nicklas; Kujala, Sami; Mäntynen, Henrik; Khayrudinov, Vladislav; Autere, Anton; Sun, Zhipei; Lipsanen, Harri

Kakko, Joona-Pekko; Matikainen, Antti; Anttu, Nicklas; Kujala, Sami; Mäntynen, Henrik; Khayrudinov, Vladislav; Autere, Anton; Sun, Zhipei; Lipsanen, Harri.

Afiliación

Kakko JP; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland. joonapekko.kakko@iki.fi.
Matikainen A; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland.
Anttu N; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland.
Kujala S; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland.
Mäntynen H; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland.
Khayrudinov V; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland.
Autere A; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland.
Sun Z; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland.
Lipsanen H; Department of Electronics and Nanoengineering, Aalto University, P.O.Box 13500, FI-00076, Aalto, Finland.

Sci Rep ; 7(1): 17790, 2017 12 19.

Article en En | MEDLINE | ID: mdl-29259279

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2017 Tipo del documento: Article País de afiliación: Finlandia

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