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The device level modulation of carrier transport in a 2D WSe2 field effect transistor via a plasma treatment.
Moon, Inyong; Lee, Sungwon; Lee, Myeongjin; Kim, Changsik; Seol, Daehee; Kim, Yunseok; Kim, Ki Hyun; Yeom, Geun Young; Teherani, James T; Hone, James; Yoo, Won Jong.
Afiliación
  • Moon I; SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Korea. yoowj@skku.edu.
  • Lee S; SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Korea. yoowj@skku.edu.
  • Lee M; SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Korea. yoowj@skku.edu.
  • Kim C; SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Korea. yoowj@skku.edu.
  • Seol D; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066 Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do, 16419 Korea.
  • Kim Y; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066 Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do, 16419 Korea.
  • Kim KH; School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066 Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do, 16419 Korea.
  • Yeom GY; SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Korea. yoowj@skku.edu and School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066 Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do, 16419 Korea.
  • Teherani JT; Department of Electrical Engineering, Columbia University, New York, NY 10027, USA.
  • Hone J; Department of Mechanical Engineering, Columbia University, New York, NY 10027, USA.
  • Yoo WJ; SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 16419, Korea. yoowj@skku.edu.
Nanoscale ; 11(37): 17368-17375, 2019 Oct 07.
Article en En | MEDLINE | ID: mdl-31524214

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2019 Tipo del documento: Article

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Año: 2019 Tipo del documento: Article
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