Probing Charge Transport Difference in Parallel and Vertical Layered Electronics with Thin Graphite Source/Drain Contacts.

Li, Jiayi; Lee, Ko-Chun; Hsieh, Meng-Hsun; Yang, Shih-Hsien; Chang, Yuan-Ming; Chang, Jen-Kuei; Lin, Che-Yi; Lin, Yen-Fu

Li, Jiayi; Lee, Ko-Chun; Hsieh, Meng-Hsun; Yang, Shih-Hsien; Chang, Yuan-Ming; Chang, Jen-Kuei; Lin, Che-Yi; Lin, Yen-Fu.

Afiliación

Li J; College of Physics, Sichuan University, Chengdu, Sichuan, 610064, China.
Lee KC; Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan.
Hsieh MH; Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan.
Yang SH; Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan.
Chang YM; Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan.
Chang JK; Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan.
Lin CY; Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan.
Lin YF; Department of Physics, National Chung Hsing University, Taichung, 40227, Taiwan.

Sci Rep ; 9(1): 20087, 2019 Dec 27.

Article en En | MEDLINE | ID: mdl-31882987

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2019 Tipo del documento: Article País de afiliación: China