Fully-automatic defects classification and restoration for STM images.

Fan, Xian-Guang; Wu, Yi; Zhi, Yu-Liang; Xia, Hong; Wang, Xin

Fan, Xian-Guang; Wu, Yi; Zhi, Yu-Liang; Xia, Hong; Wang, Xin.

Afiliación

Fan XG; Department of Instrumental and Electrical Engineering, Xiamen University, Xiamen, Fujian, 361005, PR China; Fujian Key Laboratory of Universities and Colleges for Transducer Technology, Xiamen, Fujian, 361005, PR China.
Wu Y; Department of Instrumental and Electrical Engineering, Xiamen University, Xiamen, Fujian, 361005, PR China.
Zhi YL; Department of Instrumental and Electrical Engineering, Xiamen University, Xiamen, Fujian, 361005, PR China.
Xia H; Department of Instrumental and Electrical Engineering, Xiamen University, Xiamen, Fujian, 361005, PR China.
Wang X; Department of Instrumental and Electrical Engineering, Xiamen University, Xiamen, Fujian, 361005, PR China; Fujian Key Laboratory of Universities and Colleges for Transducer Technology, Xiamen, Fujian, 361005, PR China. Electronic address: xinwang@xmu.edu.cn.

Micron ; 130: 102798, 2020 03.

Article en En | MEDLINE | ID: mdl-31884199

Asunto(s)

Algoritmos; Automatización/métodos; Procesamiento de Imagen Asistido por Computador/métodos; Microscopía de Túnel de Rastreo; Humanos; Redes Neurales de la Computación

Palabras clave

Classification; DCNN; Image processing; RPCA; Restoration; STM

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Automatización / Algoritmos / Procesamiento de Imagen Asistido por Computador / Microscopía de Túnel de Rastreo Tipo de estudio: Prognostic_studies Límite: Humans Idioma: En Revista: Micron Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2020 Tipo del documento: Article

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google