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Optical fiber interferometer application for high electron density measurements on compact torus plasmas.
Zhang, Sen; Chen, Chen; Lan, Tao; Ding, Weixing; Zhuang, Ge; Mao, Wenzhe; Lan, Shijie; Wu, Jie; Xu, Hangqi; Deng, Tijian; Zhu, Junfeng; Wu, Jiaren; Zu, Yiming; Kong, Defeng; Zhang, Shoubiao; Yao, Yuan; Wei, Zian; Liu, Zixi; Zhou, Haiyang; Wang, Hai; Wen, Xiaohui; Liu, Ahdi; Xie, Jinlin; Li, Hong; Xiao, Chijin; Liu, Wandong.
Afiliación
  • Zhang S; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Chen C; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Lan T; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Ding W; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Zhuang G; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Mao W; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Lan S; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Wu J; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Xu H; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Deng T; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Zhu J; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Wu J; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Zu Y; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Kong D; Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031, China.
  • Zhang S; Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031, China.
  • Yao Y; Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031, China.
  • Wei Z; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Liu Z; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Zhou H; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Wang H; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Wen X; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Liu A; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Xie J; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Li H; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Xiao C; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
  • Liu W; KTX Laboratory and Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026, China.
Rev Sci Instrum ; 91(6): 063501, 2020 Jun 01.
Article en En | MEDLINE | ID: mdl-32611014

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2020 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2020 Tipo del documento: Article País de afiliación: China
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