Deep Learning Segmentation of Complex Features in Atomic-Resolution Phase-Contrast Transmission Electron Microscopy Images.

Sadre, Robbie; Ophus, Colin; Butko, Anastasiia; Weber, Gunther H

Sadre, Robbie; Ophus, Colin; Butko, Anastasiia; Weber, Gunther H.

Afiliación

Sadre R; Computational Research Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA94720, USA.
Ophus C; NCEM, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA94720, USA.
Butko A; Computational Research Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA94720, USA.
Weber GH; Computational Research Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA94720, USA.

Microsc Microanal ; 27(4): 804-814, 2021 Aug.

Article en En | MEDLINE | ID: mdl-34353384

Palabras clave

automated segmentation; defects; high-resolution transmission electron microscopy; machine learning; monolayer graphene

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2021 Tipo del documento: Article País de afiliación: Estados Unidos

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