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X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors.
Muralikrishnan, Bala; Shilling, Meghan; Phillips, Steve; Ren, Wei; Lee, Vincent; Kim, Felix.
Afiliación
  • Muralikrishnan B; National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
  • Shilling M; National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
  • Phillips S; National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
  • Ren W; National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
  • Lee V; National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
  • Kim F; National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
J Res Natl Inst Stand Technol ; 124: 1-13, 2019.
Article en En | MEDLINE | ID: mdl-34877154
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: J Res Natl Inst Stand Technol Año: 2019 Tipo del documento: Article
Texto completo
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Imprimir
XML
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: J Res Natl Inst Stand Technol Año: 2019 Tipo del documento: Article