Mode-localized accelerometer in the nonlinear Duffing regime with 75 ng bias instability and 95 ng/âHz noise floor.

Zhang, Hemin; Pandit, Milind; Sobreviela, Guillermo; Parajuli, Madan; Chen, Dongyang; Sun, Jiangkun; Zhao, Chun; Seshia, Ashwin A

Mode-localized accelerometer in the nonlinear Duffing regime with 75 ng bias instability and 95 ng/âHz noise floor.

Zhang, Hemin; Pandit, Milind; Sobreviela, Guillermo; Parajuli, Madan; Chen, Dongyang; Sun, Jiangkun; Zhao, Chun; Seshia, Ashwin A.

Afiliación

Zhang H; The Nanoscience Centre, University of Cambridge, Cambridge, CB3 0FF UK.
Pandit M; Silicon Microgravity Ltd., Cambridge Innovation Park, Cambridge, CB25 9PB UK.
Sobreviela G; Silicon Microgravity Ltd., Cambridge Innovation Park, Cambridge, CB25 9PB UK.
Parajuli M; The Nanoscience Centre, University of Cambridge, Cambridge, CB3 0FF UK.
Chen D; The Nanoscience Centre, University of Cambridge, Cambridge, CB3 0FF UK.
Sun J; The Nanoscience Centre, University of Cambridge, Cambridge, CB3 0FF UK.
Zhao C; MOE Key Laboratory of Fundamental Physical Quantities Measurement and Hubei Key Laboratory of Gravitation and Quantum Physics, PGMF and School of Physics, Huazhong University of Science and Technology, 430074 Wuhan, China.
Seshia AA; The Nanoscience Centre, University of Cambridge, Cambridge, CB3 0FF UK.

Microsyst Nanoeng ; 8: 17, 2022.

Article en En | MEDLINE | ID: mdl-35178247

Palabras clave

Electrical and electronic engineering; Physics

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Microsyst Nanoeng Año: 2022 Tipo del documento: Article

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