Growth, Raman Scattering Investigation and Photodetector Properties of 2D SnP.

Ding, Chuyun; Yao, Yuyu; Zhu, Leilei; Shang, Honghui; Xu, Peng; Liu, Xiaolin; Lin, Jia; Wang, Feng; Zhan, Xueying; He, Jun; Wang, Zhenxing

Ding, Chuyun; Yao, Yuyu; Zhu, Leilei; Shang, Honghui; Xu, Peng; Liu, Xiaolin; Lin, Jia; Wang, Feng; Zhan, Xueying; He, Jun; Wang, Zhenxing.

Afiliación

Ding C; Department of Physics, Shanghai Key Laboratory of Materials Protection and Advanced Materials in Electric Power, Shanghai University of Electric Power, Shanghai, 200090, China.
Yao Y; National Center for Nanoscience and Technology, Beijing, 100190, China.
Zhu L; National Center for Nanoscience and Technology, Beijing, 100190, China.
Shang H; Sino-Danish college, University of Chinese Academy of Sciences, Beijing, 100049, China.
Xu P; Department of Chemical Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui Province, 230026, China.
Liu X; State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, 100190, China.
Lin J; National Center for Nanoscience and Technology, Beijing, 100190, China.
Wang F; Department of Physics, Shanghai Key Laboratory of Materials Protection and Advanced Materials in Electric Power, Shanghai University of Electric Power, Shanghai, 200090, China.
Zhan X; Department of Physics, Shanghai Key Laboratory of Materials Protection and Advanced Materials in Electric Power, Shanghai University of Electric Power, Shanghai, 200090, China.
He J; National Center for Nanoscience and Technology, Beijing, 100190, China.
Wang Z; National Center for Nanoscience and Technology, Beijing, 100190, China.

Small ; 18(16): e2108017, 2022 Apr.

Article en En | MEDLINE | ID: mdl-35277924

Palabras clave

2D layered materials; Raman scattering; SnP nanosheets; chemical vapor deposition; field-effect transistors (FETs)

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Small Asunto de la revista: ENGENHARIA BIOMEDICA Año: 2022 Tipo del documento: Article País de afiliación: China

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