Stoichiometry and Morphology Analysis of Thermally Deposited V2O5-x Thin Films for Si/V2O5-x Heterojunction Solar Cell Applications.

Jeong, Gwan Seung; Jung, Yoon-Chae; Park, Na Yeon; Yu, Young-Jin; Lee, Jin Hee; Seo, Jung Hwa; Choi, Jea-Young

Stoichiometry and Morphology Analysis of Thermally Deposited V₂O_5-x Thin Films for Si/V₂O_5-x Heterojunction Solar Cell Applications.

Jeong, Gwan Seung; Jung, Yoon-Chae; Park, Na Yeon; Yu, Young-Jin; Lee, Jin Hee; Seo, Jung Hwa; Choi, Jea-Young.

Afiliación

Jeong GS; Department of Metallurgical Engineering, Dong-A University, Busan 49315, Korea.
Jung YC; Department of Metallurgical Engineering, Dong-A University, Busan 49315, Korea.
Park NY; Department of Metallurgical Engineering, Dong-A University, Busan 49315, Korea.
Yu YJ; Department of Metallurgical Engineering, Dong-A University, Busan 49315, Korea.
Lee JH; Department of Chemical Engineering, Dong-A University, Busan 49315, Korea.
Seo JH; Department of Physics, University of Seoul, Seoul 02504, Korea.
Choi JY; Department of Materials Sciences & Engineering, Dong-A University, Busan 49315, Korea.

Materials (Basel) ; 15(15)2022 Jul 29.

Article en En | MEDLINE | ID: mdl-35955177

Palabras clave

heterojunction solar cell; passivation; transition metal oxide; vanadium oxide

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2022 Tipo del documento: Article