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In-Memory-Computed Low-Frequency Noise Spectroscopy for Selective Gas Detection Using a Reducible Metal Oxide.
Shin, Wonjun; Kim, Jaehyeon; Jung, Gyuweon; Ju, Suyeon; Park, Sung-Ho; Jeong, Yujeong; Hong, Seongbin; Koo, Ryun-Han; Yang, Yeongheon; Kim, Jae-Joon; Han, Seungwu; Lee, Jong-Ho.
Afiliación
  • Shin W; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Kim J; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Jung G; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Ju S; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
  • Park SH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Jeong Y; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Hong S; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Koo RH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Yang Y; Research and Development Division, SK Hynix Inc., Icheon, 17736, Republic of Korea.
  • Kim JJ; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Han S; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
  • Lee JH; Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
Adv Sci (Weinh) ; 10(7): e2205725, 2023 Mar.
Article en En | MEDLINE | ID: mdl-36646505
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Adv Sci (Weinh) Año: 2023 Tipo del documento: Article
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Adv Sci (Weinh) Año: 2023 Tipo del documento: Article