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Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling.
Zhang, Hao-Tian; He, Rong; Peng, Lei; Yang, Yu-Ting; Sun, Xiao-Jie; Zhang, Yu-Shan; Zheng, Yu-Xiang; Liu, Bao-Jian; Zhang, Rong-Jun; Wang, Song-You; Li, Jing; Lee, Young-Pak; Chen, Liang-Yao.
Afiliación
  • Zhang HT; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • He R; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Peng L; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Yang YT; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Sun XJ; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Zhang YS; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Zheng YX; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Liu BJ; High Tech Center for New Materials, Novel Devices and Cutting-Edge Manufacturing, Yiwu Research Institute, Fudan University, Yiwu 322000, China.
  • Zhang RJ; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Wang SY; Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.
  • Li J; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Lee YP; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
  • Chen LY; Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China.
Nanomaterials (Basel) ; 13(3)2023 Jan 18.
Article en En | MEDLINE | ID: mdl-36770343
It is of great technological importance in the field of plasmonic color generation to establish and understand the relationship between optical responses and the reflectance of metallic nanoparticles. Previously, a series of indium nanoparticle ensembles were fabricated using electron beam evaporation and inspected using spectroscopic ellipsometry (SE). The multi-oscillator Lorentz-Drude model demonstrated the optical responses of indium nanoparticles with different sizes and size distributions. The reflectance spectra and colorimetry characteristics of indium nanoparticles with unimodal and bimodal size distributions were interpreted based on the SE analysis. The trends of reflectance spectra were explained by the transfer matrix method. The effects of optical constants n and k of indium on the reflectance were demonstrated by mapping the reflectance contour lines on the n-k plane. Using oscillator decomposition, the influence of different electron behaviors in various indium structures on the reflectance spectra was revealed intuitively. The contribution of each oscillator on the colorimetry characteristics, including hue, lightness and saturation, were determined and discussed from the reflectance spectral analysis.
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Nanomaterials (Basel) Año: 2023 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Nanomaterials (Basel) Año: 2023 Tipo del documento: Article País de afiliación: China
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