Nanoscale imaging of super-high-frequency microelectromechanical resonators with femtometer sensitivity.

Lee, Daehun; Jahanbani, Shahin; Kramer, Jack; Lu, Ruochen; Lai, Keji

Lee, Daehun; Jahanbani, Shahin; Kramer, Jack; Lu, Ruochen; Lai, Keji.

Afiliación

Lee D; Department of Physics, University of Texas at Austin, Austin, TX, 78712, USA.
Jahanbani S; Department of Physics, University of Texas at Austin, Austin, TX, 78712, USA.
Kramer J; Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX, 78712, USA.
Lu R; Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX, 78712, USA. ruochen@utexas.edu.
Lai K; Department of Physics, University of Texas at Austin, Austin, TX, 78712, USA. kejilai@physics.utexas.edu.

Nat Commun ; 14(1): 1188, 2023 Mar 02.

Article en En | MEDLINE | ID: mdl-36864039

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Nat Commun Asunto de la revista: BIOLOGIA / CIENCIA Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos

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