Large-scale time-lapse scanning electron microscopy image mosaic using a smooth stitching strategy.

Zhao, Binglu; Zhang, Kaidi; Liu, Peng; Chen, Yuhang

Zhao, Binglu; Zhang, Kaidi; Liu, Peng; Chen, Yuhang.

Afiliación

Zhao B; Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China.
Zhang K; Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei, China.
Liu P; Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China.
Chen Y; Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei, China.

Microsc Res Tech ; 86(8): 929-942, 2023 Aug.

Article en En | MEDLINE | ID: mdl-37119500

Palabras clave

image mosaic; integrated circuit chip inspection; scanning electron microscopy; smooth stitching field; sub-area matching

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Res Tech Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2023 Tipo del documento: Article País de afiliación: China

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google