IoT-Enabled Few-Shot Image Generation for Power Scene Defect Detection Based on Self-Attention and Global-Local Fusion.

Chen, Yi; Yan, Yunfeng; Wang, Xianbo; Zheng, Yi

Chen, Yi; Yan, Yunfeng; Wang, Xianbo; Zheng, Yi.

Afiliación

Chen Y; College of Electrical Engineering, Zhejiang University, Hangzhou 310058, China.
Yan Y; School of Mechanical Engineering, Zhejiang University, Hangzhou 310027, China.
Wang X; Hainan Institute of Zhejiang University, Sanya 572025, China.
Zheng Y; Hainan Institute of Zhejiang University, Sanya 572025, China.

Sensors (Basel) ; 23(14)2023 Jul 19.

Article en En | MEDLINE | ID: mdl-37514825

Palabras clave

few-shot image generation; multi-view feature fusion; power scenarios; self-attention encoder

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies / Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article País de afiliación: China

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