Exploring the Interpad Gap Region in Ultra-Fast Silicon Detectors: Insights into Isolation Structure and Electric Field Effects on Charge Multiplication.

Lastovicka-Medin, Gordana; Rebarz, Mateusz; Doknic, Jovana; Bozovic, Ivona; Kramberger, Gregor; Lastovicka, Tomás; Andreasson, Jakob

Lastovicka-Medin, Gordana; Rebarz, Mateusz; Doknic, Jovana; Bozovic, Ivona; Kramberger, Gregor; Lastovicka, Tomás; Andreasson, Jakob.

Afiliación

Lastovicka-Medin G; Faculty of Natural Sciences and Mathematics, University of Montenegro, Dzordza Vashingtona, 81000 Podgorica, Montenegro.
Rebarz M; ELI Beamlines Facility, The Extreme Light Infrastructure ERIC, Za Radnicí 835, 25241 Dolní Brezany, Czech Republic.
Doknic J; Faculty of Natural Sciences and Mathematics, University of Montenegro, Dzordza Vashingtona, 81000 Podgorica, Montenegro.
Bozovic I; Faculty of Natural Sciences and Mathematics, University of Montenegro, Dzordza Vashingtona, 81000 Podgorica, Montenegro.
Kramberger G; Jozef Stefan Institute, Jamova Cesta 39, 10 000 Ljubljana, Slovenia.
Lastovicka T; Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 18221 Prague 8, Czech Republic.
Andreasson J; ELI Beamlines Facility, The Extreme Light Infrastructure ERIC, Za Radnicí 835, 25241 Dolní Brezany, Czech Republic.

Sensors (Basel) ; 23(15)2023 Jul 28.

Article en En | MEDLINE | ID: mdl-37571529

Palabras clave

TCT; fs-laser; interpixel region; isolation structure; segmented UFSD

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article