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Exploratory study of a multifrequency EIT-based method for detecting intracranial abnormalities.
Ma, Jieshi; Guo, Jie; Li, Yang; Wang, Zheng; Dong, Yunpeng; Ma, Jianxing; Zhu, Yan; Wu, Guan; Yi, Liang; Shi, Xuetao.
Afiliación
  • Ma J; Department of Medical Engineering, Army Medical Center of PLA, Chongqing, China.
  • Guo J; Institute of Medical Research, Northwestern Polytechnical University, Xi'an, China.
  • Li Y; Department of Medical Engineering, Army Medical Center of PLA, Chongqing, China.
  • Wang Z; Department of Neurosurgery, Army Medical Center of PLA, Chongqing, China.
  • Dong Y; Department of Neurosurgery, Army Medical Center of PLA, Chongqing, China.
  • Ma J; Department of Neurosurgery, Army Medical Center of PLA, Chongqing, China.
  • Zhu Y; Hangzhou Utron Technology Co., Ltd., Hangzhou, China.
  • Wu G; Hangzhou Utron Technology Co., Ltd., Hangzhou, China.
  • Yi L; Department of Neurosurgery, Army Medical Center of PLA, Chongqing, China.
  • Shi X; Department of Medical Electronic Engineering, School of Biomedical Engineering, Air Force Medical University of PLA, Xi'an, China.
Front Neurol ; 14: 1210991, 2023.
Article en En | MEDLINE | ID: mdl-37638201
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Front Neurol Año: 2023 Tipo del documento: Article País de afiliación: China
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Front Neurol Año: 2023 Tipo del documento: Article País de afiliación: China