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Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO2 Resistive Random Access Memories to Address Device Variability.
Swoboda, Timm; Gao, Xing; Rosário, Carlos M M; Hui, Fei; Zhu, Kaichen; Yuan, Yue; Deshmukh, Sanchit; Köroǧlu, Çaǧil; Pop, Eric; Lanza, Mario; Hilgenkamp, Hans; Rojo, Miguel Muñoz.
Afiliación
  • Swoboda T; Department of Thermal and Fluid Engineering, Faculty of Engineering Technology, University of Twente, Enschede 7500 AE, The Netherlands.
  • Gao X; Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, Enschede 7500 AE, The Netherlands.
  • Rosário CMM; Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, Enschede 7500 AE, The Netherlands.
  • Hui F; School of Materials Science and Engineering, Zhengzhou University, Zhengzhou 450001, China.
  • Zhu K; MIND, Department of Electronic and Biomedical Engineering, Universitat de Barcelona, Barcelona 08007, Spain.
  • Yuan Y; Materials Science and Engineering Program, Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia.
  • Deshmukh S; Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Köroǧlu Ç; Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Pop E; Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Lanza M; Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States.
  • Hilgenkamp H; Precourt Institute for Energy, Stanford University, Stanford, California 94305, United States.
  • Rojo MM; Materials Science and Engineering Program, Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia.
ACS Appl Electron Mater ; 5(9): 5025-5031, 2023 Sep 26.
Article en En | MEDLINE | ID: mdl-37779889

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Clinical_trials Idioma: En Revista: ACS Appl Electron Mater Año: 2023 Tipo del documento: Article País de afiliación: Países Bajos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Clinical_trials Idioma: En Revista: ACS Appl Electron Mater Año: 2023 Tipo del documento: Article País de afiliación: Países Bajos
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