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Single-Shot Laser-Induced Switching of an Exchange Biased Antiferromagnet.
Guo, Zongxia; Wang, Junlin; Malinowski, Gregory; Zhang, Boyu; Zhang, Wei; Wang, Hangtian; Lyu, Chen; Peng, Yi; Vallobra, Pierre; Xu, Yong; Xu, Yongbing; Jenkins, Sarah; Chantrell, Roy W; Evans, Richard F L; Mangin, Stéphane; Zhao, Weisheng; Hehn, Michel.
Afiliación
  • Guo Z; Fert Beijing Institute, School of Integrated Science and Engineering, Beihang University, Beijing, 100191, China.
  • Wang J; Institut Jean Lamour, UMR CNRS, Université de Lorraine, Nancy, 54011, France.
  • Malinowski G; School of Integrated Circuits, Guangdong University of Technology, Guangdong, 510006, China.
  • Zhang B; Institut Jean Lamour, UMR CNRS, Université de Lorraine, Nancy, 54011, France.
  • Zhang W; Fert Beijing Institute, School of Integrated Science and Engineering, Beihang University, Beijing, 100191, China.
  • Wang H; Fert Beijing Institute, School of Integrated Science and Engineering, Beihang University, Beijing, 100191, China.
  • Lyu C; Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, 230012, China.
  • Peng Y; Fert Beijing Institute, School of Integrated Science and Engineering, Beihang University, Beijing, 100191, China.
  • Vallobra P; Institut Jean Lamour, UMR CNRS, Université de Lorraine, Nancy, 54011, France.
  • Xu Y; Fert Beijing Institute, School of Integrated Science and Engineering, Beihang University, Beijing, 100191, China.
  • Xu Y; Institut Jean Lamour, UMR CNRS, Université de Lorraine, Nancy, 54011, France.
  • Jenkins S; Institut Jean Lamour, UMR CNRS, Université de Lorraine, Nancy, 54011, France.
  • Chantrell RW; Fert Beijing Institute, School of Integrated Science and Engineering, Beihang University, Beijing, 100191, China.
  • Evans RFL; Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, 230012, China.
  • Mangin S; Fert Beijing Institute, School of Integrated Science and Engineering, Beihang University, Beijing, 100191, China.
  • Zhao W; Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, 230012, China.
  • Hehn M; School of Integrated Circuits, Guangdong University of Technology, Guangdong, 510006, China.
Adv Mater ; 36(21): e2311643, 2024 May.
Article en En | MEDLINE | ID: mdl-38407359
ABSTRACT
Ultrafast manipulation of magnetic order has challenged the understanding of the fundamental and dynamic properties of magnetic materials. So far single-shot magnetic switching has been limited to ferrimagnetic alloys, multilayers, and designed ferromagnetic (FM) heterostructures. In FM/antiferromagnetic (AFM) bilayers, exchange bias (He) arises from the interfacial exchange coupling between the two layers and reflects the microscopic orientation of the antiferromagnet. Here the possibility of single-shot switching of the antiferromagnet (change of the sign and amplitude of He) with a single femtosecond laser pulse in IrMn/CoGd bilayers is demonstrated. The manipulation is demonstrated in a wide range of fluences for different layer thicknesses and compositions. Atomistic simulations predict ultrafast switching and recovery of the AFM magnetization on a timescale of 2 ps. The results provide the fastest and the most energy-efficient method to set the exchange bias and pave the way to potential applications for ultrafast spintronic devices.
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Adv Mater Asunto de la revista: BIOFISICA / QUIMICA Año: 2024 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Adv Mater Asunto de la revista: BIOFISICA / QUIMICA Año: 2024 Tipo del documento: Article País de afiliación: China
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