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How does crosstalk influence the jitter of a clock signal?
Liao, Shuang; Wang, Houjun; Tong, Yuchen; Chen, Cheng; Tan, Feng; Guo, Lianping.
Afiliación
  • Liao S; Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen 518110, China.
  • Wang H; School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), No. 2006, Xiyuan Ave., West Hi-Tech Zone, 611731 Chengdu, Sichuan, China.
  • Tong Y; Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen 518110, China.
  • Chen C; School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), No. 2006, Xiyuan Ave., West Hi-Tech Zone, 611731 Chengdu, Sichuan, China.
  • Tan F; School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), No. 2006, Xiyuan Ave., West Hi-Tech Zone, 611731 Chengdu, Sichuan, China.
  • Guo L; School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), No. 2006, Xiyuan Ave., West Hi-Tech Zone, 611731 Chengdu, Sichuan, China.
Rev Sci Instrum ; 95(5)2024 May 01.
Article en En | MEDLINE | ID: mdl-38717273
ABSTRACT
The stability and accuracy of the clock signal are crucial for the proper operation of various electronic devices and systems, as they directly impact system performance. In high-speed electronic systems, the clock signal is susceptible to interference by crosstalk. Therefore, evaluating the performance of the clock signal under crosstalk disturbance is important. Jitter, commonly used as an indicator to assess the degree of this interference, plays a significant role in this evaluation. In this paper, a method is proposed for assessing crosstalk-induced jitter (CIJ) based on scattering parameters. To verify the effectiveness of the method, CIJ was measured for clock signals with frequencies of 25, 100, and 156.25 MHz. In addition, the experimental results are well in agreement with the theoretical model. Thus, the potential application of this method is to assess the performance of circuits or electronic systems.

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2024 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2024 Tipo del documento: Article País de afiliación: China
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