Reducing scanning electron microscope charging by using exponential contrast stretching technique on post-processing images.
J Microsc
; 238(1): 44-56, 2010 Apr 01.
Article
em En
| MEDLINE
| ID: mdl-20384837
ABSTRACT
An exponential contrast stretching (ECS) technique is developed to reduce the charging effects on scanning electron microscope images. Compared to some of the conventional histogram equalization methods, such as bi-histogram equalization and recursive mean-separate histogram equalization, the proposed ECS method yields better image compensation. Diode sample chips with insulating and conductive surfaces are used as test samples to evaluate the efficiency of the developed algorithm. The algorithm is implemented in software with a frame grabber card, forming the front-end video capture element.
Texto completo:
1
Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Processamento de Imagem Assistida por Computador
/
Microscopia Eletrônica de Varredura
Limite:
Animals
Idioma:
En
Revista:
J Microsc
Ano de publicação:
2010
Tipo de documento:
Article
País de afiliação:
Malásia