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Scanning transmission electron microscopy: Albert Crewe's vision and beyond.
Krivanek, Ondrej L; Chisholm, Matthew F; Murfitt, Matthew F; Dellby, Niklas.
Afiliação
  • Krivanek OL; Nion Company, 1102 8th Street, Kirkland, WA 98033, USA. krivanek@nion.com
Ultramicroscopy ; 123: 90-8, 2012 Dec.
Article em En | MEDLINE | ID: mdl-22742821
ABSTRACT
Some four decades were needed to catch up with the vision that Albert Crewe and his group had for the scanning transmission electron microscope (STEM) in the nineteen sixties and seventies attaining 0.5Å resolution, and identifying single atoms spectroscopically. With these goals now attained, STEM developments are turning toward new directions, such as rapid atomic resolution imaging and exploring atomic bonding and electronic properties of samples at atomic resolution. The accomplishments and the future challenges are reviewed and illustrated with practical examples.
Assuntos

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Microscopia Eletrônica de Transmissão e Varredura Idioma: En Revista: Ultramicroscopy Ano de publicação: 2012 Tipo de documento: Article País de afiliação: Estados Unidos

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Microscopia Eletrônica de Transmissão e Varredura Idioma: En Revista: Ultramicroscopy Ano de publicação: 2012 Tipo de documento: Article País de afiliação: Estados Unidos
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