Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis.
Ultramicroscopy
; 125: 59-65, 2013 Feb.
Article
em En
| MEDLINE
| ID: mdl-23274686
ABSTRACT
A method is presented to use an electron microscope in transmission mode to determine the mis-tilt from a zone axis of a crystalline material. The method involves recording a number of additional diffraction patterns with incident beams tilted over 2 to 3 degrees. It is shown that an accuracy of 0.02 degree can be achieved, which is far better than that of the specimen-stage tilt axes, which is about 0.1 degree for the ß-tilt.
Texto completo:
1
Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
Ultramicroscopy
Ano de publicação:
2013
Tipo de documento:
Article
País de afiliação:
Holanda