Measurement of high-energy (10-60 keV) x-ray spectral line widths with eV accuracy.

Seely, J F; Glover, J L; Hudson, L T; Ralchenko, Y; Henins, Albert; Pereira, N; Feldman, U; Di Stefano, C A; Kuranz, C C; Drake, R P; Chen, Hui; Williams, G J; Park, J

Seely, J F; Glover, J L; Hudson, L T; Ralchenko, Y; Henins, Albert; Pereira, N; Feldman, U; Di Stefano, C A; Kuranz, C C; Drake, R P; Chen, Hui; Williams, G J; Park, J.

Afiliação

Seely JF; Artep Inc., 2922 Excelsior Springs Court, Ellicott City, Maryland 21042, USA.
Glover JL; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Hudson LT; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Ralchenko Y; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Henins A; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Pereira N; Ecopulse Inc., P. O. Box 528, Springfield, Virginia 22152, USA.
Feldman U; Artep Inc., 2922 Excelsior Springs Court, Ellicott City, Maryland 21042, USA.
Di Stefano CA; University of Michigan, Ann Arbor, Michigan 48109, USA.
Kuranz CC; University of Michigan, Ann Arbor, Michigan 48109, USA.
Drake RP; University of Michigan, Ann Arbor, Michigan 48109, USA.
Chen H; Lawrence Livermore National Laboratory, Livermore, California 94551, USA.
Williams GJ; Lawrence Livermore National Laboratory, Livermore, California 94551, USA.
Park J; Lawrence Livermore National Laboratory, Livermore, California 94551, USA.

Rev Sci Instrum ; 85(11): 11D618, 2014 Nov.

Article em En | MEDLINE | ID: mdl-25430194

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2014 Tipo de documento: Article País de afiliação: Estados Unidos

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