Investigation of the hard x-ray background in backlit pinhole imagers.

Fein, J R; Peebles, J L; Keiter, P A; Holloway, J P; Klein, S R; Kuranz, C C; Manuel, M J-E; Drake, R P

Fein, J R; Peebles, J L; Keiter, P A; Holloway, J P; Klein, S R; Kuranz, C C; Manuel, M J-E; Drake, R P.

Afiliação

Fein JR; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Peebles JL; Center for Energy Research, University of California, San Diego, La Jolla, California 92093, USA.
Keiter PA; Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Holloway JP; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Klein SR; Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Kuranz CC; Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Manuel MJ; Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Drake RP; Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.

Rev Sci Instrum ; 85(11): 11E610, 2014 Nov.

Article em En | MEDLINE | ID: mdl-25430356

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2014 Tipo de documento: Article País de afiliação: Estados Unidos

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