Orientation contrast of secondary electron images from electropolished metals.

Chen, D; Chang, C P; Loretto, M H

Chen, D; Chang, C P; Loretto, M H.

Afiliação

Chen D; Research Center for Physical Properties and Microstructure of Metals, Department of Materials and Optoelectronic Science, National Sun Yat-Sen University, Kaohsiung 80424, Taiwan, ROC.
Chang CP; Research Center for Physical Properties and Microstructure of Metals, Department of Materials and Optoelectronic Science, National Sun Yat-Sen University, Kaohsiung 80424, Taiwan, ROC. Electronic address: cpchang@mail.nsysu.edu.tw.
Loretto MH; IRC in Materials, School of Metallurgy and Materials, The University of Birmingham, Edgbaston B15 2TT, UK.

Ultramicroscopy ; 156: 41-9, 2015 Sep.

Article em En | MEDLINE | ID: mdl-25980953

Palavras-chave

Electropolishing; Metals; Orientation contrast; SEM

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2015 Tipo de documento: Article