Mitigation of hard x-ray background in backlit pinhole imagers.

Fein, J R; Keiter, P A; Holloway, J P; Klein, S R; Davis, J S; Drake, R P

Fein, J R; Keiter, P A; Holloway, J P; Klein, S R; Davis, J S; Drake, R P.

Afiliação

Fein JR; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Keiter PA; Department of Climate and Space Sciences and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Holloway JP; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Klein SR; Department of Climate and Space Sciences and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Davis JS; Department of Climate and Space Sciences and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.
Drake RP; Department of Climate and Space Sciences and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2143, USA.

Rev Sci Instrum ; 87(11): 11E341, 2016 Nov.

Article em En | MEDLINE | ID: mdl-27910560

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Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Estados Unidos

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