Quantifying SIMS of Organic Mixtures and Depth Profiles-Characterizing Matrix Effects of Fragment Ions.

Seah, M P; Havelund, R; Spencer, S J; Gilmore, I S

Seah, M P; Havelund, R; Spencer, S J; Gilmore, I S.

Afiliação

Seah MP; Analytical Science Division, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK. martin.seah@npl.co.uk.
Havelund R; Analytical Science Division, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK.
Spencer SJ; Analytical Science Division, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK.
Gilmore IS; Analytical Science Division, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK.

J Am Soc Mass Spectrom ; 30(2): 309-320, 2019 Feb.

Article em En | MEDLINE | ID: mdl-30353290

Palavras-chave

Analysis; Matrix factors; Organic solid mixtures; Quantification; SIMS; Secondary ion mass spectrometry

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Am Soc Mass Spectrom Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Reino Unido

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