Skyrmion Phase in MnSi Thin Films Grown on Sapphire by a Conventional Sputtering.

Choi, Won-Young; Bang, Hyun-Woo; Chun, Seung-Hyun; Lee, Sunghun; Jung, Myung-Hwa

Choi, Won-Young; Bang, Hyun-Woo; Chun, Seung-Hyun; Lee, Sunghun; Jung, Myung-Hwa.

Afiliação

Choi WY; Department of Physics, Sogang University, Seoul, 04107, Korea.
Bang HW; Department of Physics, Sogang University, Seoul, 04107, Korea.
Chun SH; Department of Physics, Sejong University, Seoul, 05006, Korea.
Lee S; Department of Physics, Sejong University, Seoul, 05006, Korea. kshlee@sejong.ac.kr.
Jung MH; Department of Physics, Sogang University, Seoul, 04107, Korea. mhjung@sogang.ac.kr.

Nanoscale Res Lett ; 16(1): 7, 2021 Jan 06.

Article em En | MEDLINE | ID: mdl-33409649

Palavras-chave

MnSi; Polycrystal; Skyrmion; Sputtering; Topological Hall effect

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Qualitative_research Idioma: En Revista: Nanoscale Res Lett Ano de publicação: 2021 Tipo de documento: Article

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