Electric Control of 2D Van Hove Singularity in Oxide Ultra-Thin Films.

Kim, Donghan; Kim, Younsik; Sohn, Byungmin; Kim, Minsoo; Kim, Bongju; Noh, Tae Won; Kim, Changyoung

Kim, Donghan; Kim, Younsik; Sohn, Byungmin; Kim, Minsoo; Kim, Bongju; Noh, Tae Won; Kim, Changyoung.

Afiliação

Kim D; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.
Kim Y; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea.
Sohn B; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.
Kim M; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea.
Kim B; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.
Noh TW; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, South Korea.
Kim C; Center for Correlated Electron Systems, Institute for Basic Science, Seoul, 08826, South Korea.

Adv Mater ; 35(17): e2207188, 2023 Apr.

Article em En | MEDLINE | ID: mdl-36764325

Palavras-chave

Hall effect; angle-resolved photoemission spectroscopy; electronic structure; ionic liquid gating; oxide thin film; ruthenate; transport measurement; ultrathin film; van Hove singularity (VHS)

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Adv Mater Assunto da revista: BIOFISICA / QUIMICA Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Coréia do Sul

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