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A cycle-level recovery method for embedded processor against HT tamper.
Zhou, Wanting; Ye, Kuo-Hui; Yuan, Shiwei; Li, Lei.
Afiliação
  • Zhou W; Research Institute of Electronic Science and Technology, University of Electronic Science and Technology of China, No. 2006, Xi Yuan Ave., West High-Tech Zone, Chengdu, 611731, Sichuan, China.
  • Ye KH; Department of Information Management, National Dong Hwa University, No. 1, Sec. 2, Da Hsueh Rd., Shoufeng, Hualien, 97001, Taiwan (Province of China).
  • Yuan S; Research Institute of Electronic Science and Technology, University of Electronic Science and Technology of China, No. 2006, Xi Yuan Ave., West High-Tech Zone, Chengdu, 611731, Sichuan, China.
  • Li L; Research Institute of Electronic Science and Technology, University of Electronic Science and Technology of China, No. 2006, Xi Yuan Ave., West High-Tech Zone, Chengdu, 611731, Sichuan, China.
Heliyon ; 9(6): e17085, 2023 Jun.
Article em En | MEDLINE | ID: mdl-37360108
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Heliyon Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China
Texto completo
Adicionar na Minha BVS
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Heliyon Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China