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Continuous roller nanoimprinting: next generation lithography.
Peng, Zhiting; Zhang, Yage; Choi, Chin Long Ronald; Zhang, Pengcheng; Wu, Tianzhun; Chan, Yau Kei.
Afiliação
  • Peng Z; Department of Ophthalmology, The University of Hong Kong, Pokfulam Road, Hong Kong, China. jchanyk@hku.hk.
  • Zhang Y; Department of Mechanical Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, China.
  • Choi CLR; Department of Ophthalmology, The University of Hong Kong, Pokfulam Road, Hong Kong, China. jchanyk@hku.hk.
  • Zhang P; Institute of Biomedical and Health Engineering, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, China. tz.wu@siat.ac.cn.
  • Wu T; Institute of Biomedical and Health Engineering, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, China. tz.wu@siat.ac.cn.
  • Chan YK; Department of Ophthalmology, The University of Hong Kong, Pokfulam Road, Hong Kong, China. jchanyk@hku.hk.
Nanoscale ; 15(27): 11403-11421, 2023 Jul 13.
Article em En | MEDLINE | ID: mdl-37376894
ABSTRACT
Nanoimprint lithography (NIL) is a cost-effective and high-throughput technique for replicating nanoscale structures that does not require expensive light sources for advanced photolithography equipment. NIL overcomes the limitations of light diffraction or beam scattering in traditional photolithography and is suitable for replicating nanoscale structures with high resolution. Roller nanoimprint lithography (R-NIL) is the most common NIL technique benefiting large-scale, continuous, and efficient industrial production. In the past two decades, a range of R-NIL equipment has emerged to meet the industrial needs for applications including biomedical devices, semiconductors, flexible electronics, optical films, and interface functional materials. R-NIL equipment has a simple and compact design, which allows multiple units to be clustered together for increased productivity. These units include transmission control, resist coating, resist curing, and imprinting. This critical review summarizes the hitherto R-NIL processes, their typical technical problems, and corresponding solutions and gives guidelines for developing advanced R-NIL equipment.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanoscale Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanoscale Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China
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